Evidence map›Paper›PMID 40631703›Full record

ArticleSmall methods2026

High-Throughput Ellipsometric Contrast Microscopy of Lateral 2D Heterostructures for Optoelectronics.

Teja Potočnik, Oliver Burton, Suman K Chakraborty, Purbasha Ray, Ralf Mouthaan, Peter J Christopher, Zeinab Tirandaz, Xiaofan Lin, Hannah J Joyce, Stephan Hofmann and 2 more

Abstract read
PubMed Full text at PMC Publisher
In one paragraph

Article in Small methods, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

12 authors.

Teja PotočnikDepartment of Engineering, University of Cambridge, 9 JJ Thompson Avenue, Cambridge, CB3 0FA, UK.
Oliver BurtonDepartment of Engineering, University of Cambridge, 9 JJ Thompson Avenue, Cambridge, CB3 0FA, UK.
Suman K ChakrabortyMaterials Science Center, Indian Institute of Technology Kharagpur, Kharagpur, West Bengal, 721302, India.
Purbasha RayMaterials Science Center, Indian Institute of Technology Kharagpur, Kharagpur, West Bengal, 721302, India.
Ralf MouthaanCentre of Light for Life, University of Adelaide, North Terrace, Adelaide, SA, 5005, Australia.
Peter J ChristopherDepartment of Engineering, University of Nottingham, Nottingham, NG7 2RD, UK.
Zeinab TirandazDepartment of Engineering, University of Cambridge, 9 JJ Thompson Avenue, Cambridge, CB3 0FA, UK.
Xiaofan LinDepartment of Engineering, University of Cambridge, 9 JJ Thompson Avenue, Cambridge, CB3 0FA, UK.
Hannah J JoyceDepartment of Engineering, University of Cambridge, 9 JJ Thompson Avenue, Cambridge, CB3 0FA, UK.
Stephan HofmannDepartment of Engineering, University of Cambridge, 9 JJ Thompson Avenue, Cambridge, CB3 0FA, UK.
Prasana K SahooMaterials Science Center, Indian Institute of Technology Kharagpur, Kharagpur, West Bengal, 721302, India.
Jack A Alexander-WebberDepartment of Engineering, University of Cambridge, 9 JJ Thompson Avenue, Cambridge, CB3 0FA, UK.ORCID https://orcid.org/0000-0002-9374-7423

Funding

Department of Science and Technology, Ministry of Science and Technology, India DST/NM/TUE/QM-1/2019Department of Science and Technology, Ministry of Science and Technology, India DST/TDT/AMT/2021/003 (G)&(C)Engineering and Physical Sciences Research Council EP/T001038/1Engineering and Physical Sciences Research Council EP/T008369/1Engineering and Physical Sciences Research Council EP/V055003/1Engineering and Physical Sciences Research Council EP/Z002583/1European Research Council 716471(ACrossWire)Royal Society Royal Society Dorothy Hodgkin Research Fellowship
6 · The paper itself

Abstract

Covalently-bonded lateral 2D heterostructures offer unique (opto)electronic functionalities and can be deposited during a single growth process. However, the position of lateral junctions is typically uncontrolled due to random nucleation processes, which necessitates post-growth identification of suitable heterojunction regions for device integration. Here, ellipsometric contrast microscopy (ECM) is demonstrated to evaluate 2D lateral monolayer MoSe

Indexed as

2D materialscomputer visionellipsometric contrast microscopyhigh‐throughput characterizationlateral heterostructuresoptoelectronic devices

Identifiers

PMID40631703
PMCPMC12825334

What OpenQuestion holds

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Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.