Evidence map›Paper›PMID 40596192›Full record

ArticleScientific reports2025

Effect of microwave vacuum puffing conditions on the dielectric properties of berries.

Haijun Liu, Wei Zhao, Shikang Li, Lan Zhang, Tingting Chen, Hui Wang, Jian Zhang

Abstract read
In one paragraph

Article in Scientific reports, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Review
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

7 authors.

Haijun LiuSchool of Intelligent Manufacturing, Huzhou College, Huzhou, 313000, China.
Wei ZhaoSchool of Intelligent Manufacturing, Huzhou College, Huzhou, 313000, China.
Shikang LiSchool of Intelligent Manufacturing, Huzhou College, Huzhou, 313000, China.
Lan ZhangSchool of Intelligent Manufacturing, Huzhou College, Huzhou, 313000, China.
Tingting ChenSchool of Intelligent Manufacturing, Huzhou College, Huzhou, 313000, China.
Hui WangJiyang college of Zhejiang Agriculture & Forestry University, Zhuji, 311800, China. h_mail@163.com.
Jian ZhangSchool of Intelligent Manufacturing, Huzhou College, Huzhou, 313000, China. zhangjian@zjhzu.edu.cn.

Funding

Huzhou college 2024HXKM01
6 · The paper itself

Abstract

The objective of this study was to study the effect of microwave vacuum puffing (MVP) conditions on dielectric properties of berries. A central composite response surface experiment, with four factors and five levels, was carried out to assess the effect of puffing conditions on the dielectric properties. The microwave volumetric heat, dielectric constant and dielectric loss factor were, accordingly, evaluated based on the dynamic dielectric property index model of berries. As a result, the initial moisture content had significant effects on the dielectric constant and dielectric loss factor of the berry crisps. Specifically, in the early stage of puffing, the dielectric constant decreases with increasing initial moisture content. However, in the later stage of puffing, the dielectric constant first decreases and then increases as the initial moisture content rises. Meanwhile, the dielectric loss factor increases consistently with increasing initial moisture content throughout the puffing process. The MVP conditions exert a complex effect on dielectric properties of berries. Based on these findings, a theoretical for the dynamic processing mode and equipment design for MVP of berries can be provided.

Indexed as

Berry crisps, dielectric propertiesEquipment designMicrowave vacuum puffing conditions

Identifiers

PMID40596192
PMCPMC12218140

What OpenQuestion holds

Textmetadata
LicenceCC BY-NC-ND
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.