Evidence map›Paper›PMID 40593015›Full record

ArticleScientific reports2025

Impact of proton-beam irradiation on the electrical reliability and performance of LTPS and a-IGZO thin-film transistors.

Junho Noh, Moonsoo Kim, Dongbhin Kim, Sungsoo Park, Hwan-Gyu Lee, Sungwoo Jung, Donghyun Kim, Nguyen Thanh Tien, Byoungdeog Choi

Abstract read
PubMed Full text at PMC Publisher
In one paragraph

Article in Scientific reports, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

9 authors.

Junho NohDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South Korea. vinvinn25@gmail.com.
Moonsoo KimDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South Korea.
Dongbhin KimDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South Korea.
Sungsoo ParkDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South Korea.
Hwan-Gyu LeeDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South Korea.
Sungwoo JungDepartment of Semiconductor Convergence Engineering, Sungkyunkwan University, Suwon, South Korea.
Donghyun KimDepartment of Semiconductor Convergence Engineering, Sungkyunkwan University, Suwon, South Korea.
Nguyen Thanh TienDisplay Research Center, Samsung Display Company Ltd., Yongin, South Korea.
Byoungdeog ChoiDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South Korea. bdchoi@skku.edu.

Funding

Korea Institute for Advancement of Technology P0012453National Research Foundation of Korea 2020R1C1C100700112
6 · The paper itself

Abstract

We investigate the impact of 5 MeV proton beam irradiation on the electrical reliability of low-temperature polycrystalline silicon (LTPS) and amorphous In-Ga-Zn-O (a-IGZO) thin-film transistors (TFTs). After irradiation, the threshold voltage (V

Indexed as

Amorphous In–Ga–Zn–O (a-IGZO)Density of state (DOS)Electrical reliabilityLow-temperature polycrystalline silicon (LTPS)RadiationThin-film transistors (TFTs)

Identifiers

PMID40593015
PMCPMC12215767

What OpenQuestion holds

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Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.