Evidence map›Paper›PMID 40573020›Full record

ArticleMaterials (Basel, Switzerland)2025

Unveiling Thickness-Dependent Oxidation Effect on Optical Response of Room Temperature RF-Sputtered Nickel Ultrathin Films on Amorphous Glass: An Experimental and FDTD Investigation.

Dylan A Huerta-Arteaga, Mitchel A Ruiz-Robles, Srivathsava Surabhi, S Shiva Samhitha, Santhosh Girish, María J Martínez-Carreón, Francisco Solís-Pomar, A Martínez-Huerta, Jong-Ryul Jeong, Eduardo Pérez-Tijerina

Abstract read
In one paragraph

Article in Materials (Basel, Switzerland), 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

10 authors.

Dylan A Huerta-ArteagaCentro de Investigación en Ciencias Físico Matemáticas, Facultad de Ciencias Físico Matemáticas, Universidad Autónoma de Nuevo León, Av. Universidad s/n, San Nicolás de los Garza 66455, Nuevo León, Mexico.
Mitchel A Ruiz-RoblesCentro de Investigación en Ciencias Físico Matemáticas, Facultad de Ciencias Físico Matemáticas, Universidad Autónoma de Nuevo León, Av. Universidad s/n, San Nicolás de los Garza 66455, Nuevo León, Mexico.ORCID 0000-0003-4834-8025
Srivathsava SurabhiCentro de Investigación en Ciencias Físico Matemáticas, Facultad de Ciencias Físico Matemáticas, Universidad Autónoma de Nuevo León, Av. Universidad s/n, San Nicolás de los Garza 66455, Nuevo León, Mexico.ORCID 0000-0003-4311-4246
S Shiva SamhithaDepartamento de Ingeniería de Materiales (DIMAT), Facultad de Ingeniería (FI), 315 Edmundo Larenas, Box 160-C, Concepción 4070409, Chile.ORCID 0000-0002-3475-3241
Santhosh GirishNanomaterials and Energy Devices Lab (NMEDL), Department of Mechanical Engineering, NMAM Institute of Technology, Nitte (Deemed to be University), Nitte, Mangalore 574110, Karnataka, India.ORCID 0000-0003-0579-923X
María J Martínez-CarreónCentro de Investigación en Ciencias Físico Matemáticas, Facultad de Ciencias Físico Matemáticas, Universidad Autónoma de Nuevo León, Av. Universidad s/n, San Nicolás de los Garza 66455, Nuevo León, Mexico.ORCID 0000-0002-9283-7857
Francisco Solís-PomarCentro de Investigación en Ciencias Físico Matemáticas, Facultad de Ciencias Físico Matemáticas, Universidad Autónoma de Nuevo León, Av. Universidad s/n, San Nicolás de los Garza 66455, Nuevo León, Mexico.ORCID 0000-0002-4536-6538
A Martínez-HuertaCentro de Investigación en Ciencias Físico Matemáticas, Facultad de Ciencias Físico Matemáticas, Universidad Autónoma de Nuevo León, Av. Universidad s/n, San Nicolás de los Garza 66455, Nuevo León, Mexico.
Jong-Ryul JeongDepartment of Materials Science and Engineering, Graduate School of Energy Science and Technology, Chungnam National University, Daejeon 305-704, Republic of Korea.ORCID 0000-0002-0295-4030
Eduardo Pérez-TijerinaCentro de Investigación en Ciencias Físico Matemáticas, Facultad de Ciencias Físico Matemáticas, Universidad Autónoma de Nuevo León, Av. Universidad s/n, San Nicolás de los Garza 66455, Nuevo León, Mexico.

Funding

ANID Beca Doctorado Nacional Folio 21221394CONAHCYT BP-PA-20220705150715748-2482439CONAHCYT CVU 1332020FONDECYT PI, Project No 3200832National Research Foundation of Korea (NRF) Project No: RS-2024-00351653, 2022R1I1A1A01064438Nitte (Deemed to be University) Project No: N/RG/NUFR1/NMAMIT/2022/03
6 · The paper itself

Abstract

Nickel (Ni) ultrathin films exhibit phase-dependent electrical, magnetic, and optical characteristics that are significantly influenced by deposition methods. However, these films are inherently prone to rapid oxidation, with the oxidation rate dependent on substrate, temperature, and deposition parameters. The focus of this research is to investigate the temporal oxidation of RF-sputtered Ni ultrathin films on Corning glass under ambient atmospheric conditions and its impact on their structural, surface, and optical characteristics. Controlled film thicknesses were achieved through precise manipulation of deposition parameters, enabling the analysis of oxidation-induced modifications. Atomic force microscopy (AFM) revealed that films with high structural integrity and surface uniformity are exhibiting roughness values (Rq) from 0.679 to 4.379 nm of corresponding thicknesses ranging from 4 to 85 nm. Scanning electron microscopy (SEM) validated the formation of Ni grains interspersed with NiO phases, facilitating SPR-like effects. UV-visible spectroscopy is demonstrating thickness-dependent spectral (plasmonic peak) shifts. Finite Difference Time Domain (FDTD) simulations corroborate the observed thickness-dependent optical absorbance and the resultant shifts in the absorbance-induced plasmonic peak position and bandgap. Increased NiO presence primarily drives the enhancement of electromagnetic (EM) field localization and the direct impact on power absorption efficiency, which are modulated by the tunability of the plasmonic peak position. Our work demonstrates that controlled fabrication conditions and optimal film thickness selection allow for accurate manipulation of the Ni oxidation process, significantly altering their optical properties. This enables the tailoring of these Ni films for applications in transparent conductive electrodes (TCEs), magneto-optic (MO) devices, spintronics, wear-resistant coatings, microelectronics, and photonics.

Indexed as

FDTD simulationsnatural (ambient) oxidationNi ultrathin filmsoptical and surficial propertiesoxidation effectRF-sputtering

Identifiers

PMID40573020
PMCPMC12195108

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.