ArticleJournal of synchrotron radiation2025
High-resolution electron-multi-ion coincidence set-up for gas-phase experiments in the tender and hard X-ray range.
Article in Journal of synchrotron radiation, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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Abstract
The MUSTACHE setup (MUlti-STep photofragmentation studies by Auger electron-ion Coincidences using High Energy photons) is a high-resolution electron-multi-ion coincidence system optimized for gas-phase experiments in the tender (∼2-10 keV) and hard (>5 keV) X-ray range. The system integrates a high-resolution hemispherical electron analyzer with a Wiley-McLaren-type ion time-of-flight (TOF) spectrometer, enabling coincidence measurements of Auger electrons and high-energy photoelectrons. Designed to overcome challenges in high-energy electron detection while maintaining excellent energy resolution, the setup covers a broad kinetic energy range up to 5 keV, allowing investigation of hard-X-ray-induced Auger cascades in molecules containing high-Z elements, where initial fluorescence decay is followed by Auger processes within this 5 keV detection window. The ion TOF spectrometer provides high-resolution ion mass and momentum analysis, essential for studying light and fast ions generated by deep-core ionization. System capabilities are demonstrated through test measurements on benchmark atomic and molecular systems, such as argon, nitrogen and carbon disulfide. These measurements demonstrate energy-resolved high-kinetic-energy photoelectron-ion coincidences and momentum-resolved multi-ion coincidences following deep-core ionization and Coulomb explosion. MUSTACHE enables investigations into deep-core ionization, Auger cascade processes and Coulomb explosion dynamics in isolated gas-phase species, offering insights into fundamental ionization and fragmentation processes. These results demonstrate that the MUSTACHE setup is a powerful tool for high-resolution electron-ion coincidence spectroscopy, extending advanced coincidence techniques into the hard X-ray regime and providing unprecedented opportunities for studying high-energy X-ray-induced phenomena.
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