Evidence map›Paper›PMID 40546000›Full record

ReviewSmall methods2025

Atomic Force Microscopy for Cross-Disciplinary Materials Research.

Soyun Joo, Seongmun Eom, Youngwoo Choi, Uichang Jeong, Yoonhan Cho, WonJeong Yu, Kunwoo Park, Seungbum Hong

Abstract readReview
In one paragraph

Review in Small methods, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 4 papers.

0numbers the graph read from it
0cells of the map it votes in
4citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

4 citing papers in PubMed.

  1. Review
  2. Article
  3. Review
  4. Review
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

8 authors.

Soyun JooDepartment of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 34141, Republic of Korea.ORCID https://orcid.org/0000-0002-7131-1813
Seongmun EomDepartment of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 34141, Republic of Korea.ORCID https://orcid.org/0000-0003-2306-021X
Youngwoo ChoiDepartment of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 34141, Republic of Korea.ORCID https://orcid.org/0000-0001-9134-8405
Uichang JeongDepartment of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 34141, Republic of Korea.ORCID https://orcid.org/0000-0001-8913-0730
Yoonhan ChoDepartment of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 34141, Republic of Korea.ORCID https://orcid.org/0009-0007-3286-4398
WonJeong YuDepartment of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 34141, Republic of Korea.ORCID https://orcid.org/0009-0007-3122-9632
Kunwoo ParkDepartment of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 34141, Republic of Korea.ORCID https://orcid.org/0009-0007-2698-4078
Seungbum HongDepartment of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 34141, Republic of Korea.ORCID https://orcid.org/0000-0002-2667-1983

Funding

Korean government RS-2023-00222411Korean government RS-2023-00247245Korean Government NRF-2022K1A4A7A04095892National Research Foundation of Korea
6 · The paper itself

Abstract

While microscopy remains the primary method for verifying material structures, recent technological advancements have both enabled and necessitated the analysis of ever-finer details. Unlike scanning electron microscopy (SEM) and transmission electron microscopy (TEM), atomic force microscopy (AFM) provides unique capabilities beyond visualization, mapping surface properties through precisely controlled physical interactions between the probe and sample. In materials research specifically, AFM has become indispensable for characterizing mechanical, electrical, chemical, and magnetic properties at the nanoscale with exceptional spatial resolution. With ongoing technological progress and the expansion of specialized imaging modes, AFM enables cross-disciplinary collaboration across various materials science domains, from electronic materials to energy storage systems. However, its effective implementation is often challenged by the technical complexity and varied domain expertise among collaborators. This review examines critical considerations in AFM-based research, from experimental protocols to quantitative data analysis. Validated approaches for measurement optimization are presented to ensure reproducibility and support successful cross-disciplinary AFM implementation. The review includes detailed implementation guidance for advanced AFM methodologies and comprehensive case studies spanning diverse material systems. By providing theoretical foundations and practical guidance, this review aims to facilitate more effective collaboration across disciplines, ultimately advancing the use of AFM in complex, multi-faceted research.

Indexed as

atomic force microscopyexperimental optimizationmicroscopy techniquesquantitative data analysissurface property mapping

Identifiers

PMID40546000
PMCPMC12641378

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.