Evidence map›Paper›PMID 40497844›Full record

ArticleNanomaterials (Basel, Switzerland)2025

Automated Detection of Micro-Scale Porosity Defects in Reflective Metal Parts via Deep Learning and Polarization Imaging.

Haozhe Li, Xing Peng, Bo Wang, Feng Shi, Yu Xia, Shucheng Li, Chong Shan, Shiqing Li

Abstract read
In one paragraph

Article in Nanomaterials (Basel, Switzerland), 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

8 authors.

Haozhe LiCollege of Intelligent Science and Technology, National University of Defense Technology, Changsha 410073, China.
Xing PengCollege of Intelligent Science and Technology, National University of Defense Technology, Changsha 410073, China.ORCID 0000-0002-6177-3715
Bo WangCollege of Intelligent Science and Technology, National University of Defense Technology, Changsha 410073, China.
Feng ShiCollege of Intelligent Science and Technology, National University of Defense Technology, Changsha 410073, China.
Yu XiaCollege of Intelligent Science and Technology, National University of Defense Technology, Changsha 410073, China.
Shucheng LiCollege of Intelligent Science and Technology, National University of Defense Technology, Changsha 410073, China.
Chong ShanState Key Laboratory of Functional Crystals and Devices, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 201899, China.
Shiqing LiCollege of Physics, Zhejiang University of Technology, Hangzhou 310023, China.

Funding

China Postdoctoral Science Foundation Grant 2024M754299National Natural Science Foundation of China 52305594Natural Science Foundation of Hunan Province 2024JJ6460
6 · The paper itself

Abstract

Aiming at the key technology of defect detection in precision additive manufacturing of highly reflective metal materials, this study proposes an enhanced SCK-YOLOV5 framework, which combines polarization imaging and deep learning methods to significantly improve the intelligent identification ability of small metal micro and nano defects. This framework introduces the SNWD (Selective Network with attention for Defect and Weathering Degradation) Loss function, which combines the SIOU Angle Loss with the NWD distribution sensing characteristics. It is specially designed for automatic positioning and identification of micrometer hole defects. At the same time, we employ global space construction with a dual-attention mechanism and multi-scale feature refining technique with selection kernel convolution to extract multi-scale defect information from highly reflective surfaces stably. Combined with the polarization imaging preprocessing and the comparison of enhancement defects under high reflectivity, the experimental results show that the proposed method significantly improves the precision, recall rate, and

Indexed as

additive manufacturingdeep learningdefect detectionmicro–nano defectpolarization imaging

Identifiers

PMID40497844
PMCPMC12156235

What OpenQuestion holds

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LicenceCC BY
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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.