Evidence map›Paper›PMID 40455872›Full record

ArticlePloS one2025

PCB-YOLO: Enhancing PCB surface defect detection with coordinate attention and multi-scale feature fusion.

Ze Wei, Fan Yang, Kezhen Zhong, Linkun Yao

Abstract read
In one paragraph

Article in PloS one, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.

0numbers the graph read from it
0cells of the map it votes in
3citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

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Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

3 citing papers in PubMed.

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4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

4 authors.

Ze WeiSchool of Electronic and Information Engineering, Hebei University of Technology, Tianjin, China.
Fan YangSchool of Electronic and Information Engineering, Hebei University of Technology, Tianjin, China.ORCID https://orcid.org/0009-0006-8207-7504
Kezhen ZhongFaculty of Computing, Harbin Institute of Technology, Harbin, China.
Linkun YaoSchool of Electronic and Information Engineering, Hebei University of Technology, Tianjin, China.

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Nowadays, industrial electronic products are integrated into all aspects of life, with PCB quality playing a decisive role in their performance. Ensuring PCB factory quality is thus crucial. Common PCB defects serve as key references for evaluating quality. To address low detection accuracy and the bulky size of existing models, we propose an improved PCB-YOLO model based on YOLOv8n.To reduce model size, we introduce a novel CRSCC module combining SCConv convolution and C2f, enhancing PCB defect detection accuracy and significantly reducing model parameters. For feature fusion, we propose the FFCA attention module, designed to handle PCB surface defect characteristics by fusing multi-scale local features. This improves spatial dependency capture, detail attention, feature resolution, and detection accuracy. Additionally, the WIPIoU loss function is developed to calculate IoU using auxiliary boundaries and address low-quality data, improving small-target recognition and accelerating convergence. Experimental results demonstrate significant improvements in PCB defect detection, with mAP50 increasing by 5.7%, and reductions of 13.3% and 14.8% in model parameters and computational complexity, respectively. Compared to mainstream models, PCB-YOLO achieves the best overall performance. The model's effectiveness and generalization are further validated on the NEU-DET steel surface defect dataset, achieving excellent results. The PCB-YOLO model offers a practical, efficient solution for PCB and steel defect detection, with broad application prospects.

Indexed as

Polychlorinated BiphenylsAlgorithmsModels, TheoreticalPolychlorinated Biphenyls

Identifiers

PMID40455872
PMCPMC12129336

What OpenQuestion holds

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LicenceCC BY
Read underepoch 390

Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.