ArticleIEEE transactions on nuclear science2025
TlBr Films for Direct Digital Radiography.
Article in IEEE transactions on nuclear science, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.
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Who cites it
1 citing paper in PubMed.
- Imaging Results from a Direct Conversion X-ray Detector with TlBr and CMOS Pixel Array.IEEE transactions on nuclear science · 2026Article
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13 authors.
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Abstract
The detector that converts X-ray intensity into a digitized electronic signal, processed into an image, often limits the performance of modern X-ray imaging systems, whether for medical, research, or industrial applications. Digital radiography uses the following two types of detectors: indirect detectors, where a scintillating film converts X-ray into an optical signal read by an optical detector, and direct detectors using semiconductors. Semiconductor X-ray detector technology typically uses a silicon wafer, an amorphous Se (aSe) film, or a relatively thin CdZnTe crystal bump bonded to a readout platform. Although the use of aSe and CdZnTe improves the attenuation coefficient beyond that of silicon, a further increase in performance is highly desirable for improved imaging off higher energy X-rays (greater than 20 keV). This paper presents results on thallium bromide (TlBr) films coupled to a read-out integrated circuit (ROIC). Thallium Bromide, an attractive material for hard X-ray imaging due to its high atomic number and high density, achieves an image resolution of 20 μm as a 1 cm
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