Evidence map›Paper›PMID 40333331›Full record

ArticleMaterials (Basel, Switzerland)2025

High Capacitance Density and Thermal Stability in Strontium.

Yilong Feng, Zhenya Lu, Ming Lv

Abstract read
In one paragraph

Article in Materials (Basel, Switzerland), 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

3 authors.

Yilong FengSchool of Materials Science and Engineering, South China University of Technology, Guangzhou 510640, China.ORCID 0009-0005-7911-1970
Zhenya LuSchool of Materials Science and Engineering, South China University of Technology, Guangzhou 510640, China.ORCID 0000-0002-5506-0145
Ming LvSchool of Materials Science and Engineering, South China University of Technology, Guangzhou 510640, China.ORCID 0000-0001-7896-2750

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Magnetron sputtering allows for the accurate estimation of film thickness. Strontium titanate (STO) thin films were deposited on Nb-doped STO substrates using radiofrequency magnetron sputtering technology. The microstructures and dielectric properties of STO thin films were investigated. X-ray diffraction (XRD) analysis indicates that uniform polycrystalline STO films were obtained after thermal annealing at 650 °C. The films exhibit a significant correlation between thickness, annealing temperature, and breakdown field strength. The optimal film with a thickness of 1150 nm achieves a capacitance density of 1688 pF/mm

Indexed as

capacitance densityRF magnetron sputteringSrTiO3 thin filmsTCC

Identifiers

PMID40333331
PMCPMC12028874

What OpenQuestion holds

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Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.