ArticleJournal of synchrotron radiation2025
Method for visualizing detailed profiles of synchrotron X-ray beams using diamond-thin films and silicon drift detectors.
Article in Journal of synchrotron radiation, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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Abstract
Contamination from nearby bending magnet radiation hinders precise and accurate determination of the true beam center of undulator radiation. To solve this problem, a semi-nondestructive method was developed to visualize the detailed profile of a synchrotron radiation beam by using a thin diamond film as a scatterer. As the beam passed through the diamond film, scattered X-rays were imaged using a pinhole camera and measured with a two-dimensional silicon drift detector (SDD) scan. With this configuration, the beam center was accurately determined by visualizing the radiation pattern distribution for each energy level of a pink X-ray beam within an aperture size of 1.5 mm × 1.5 mm, shaped by a front-end slit (FES) positioned upstream of the monochromator. Additionally, by scanning the FES in two dimensions with a reduced aperture of 0.4 mm × 0.4 mm, energy-resolved images were successfully obtained using the SDD at a fixed position. These images revealed the profile of undulator radiation over a broad area (with an aperture extending up to 4 mm) in a pre-slit positioned upstream of the FES, demonstrating good alignment with SPECTRA calculations. This method effectively eliminates contamination from nearby bending magnet radiation, a significant issue in previous approaches, enabling a direct and highly accurate determination of the true beam center.
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