Evidence map›Paper›PMID 40243625›Full record

ReviewInternational journal of molecular sciences2025

Advancements in Lithography Techniques and Emerging Molecular Strategies for Nanostructure Fabrication.

Prithvi Basu, Jyoti Verma, Vishnuram Abhinav, Ratneshwar Kumar Ratnesh, Yogesh Kumar Singla, Vibhor Kumar

Abstract readReview
In one paragraph

Review in International journal of molecular sciences, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 20 papers.

0numbers the graph read from it
0cells of the map it votes in
20citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

20 citing papers in PubMed.

  1. Review
  2. Article
  3. Article
  4. Review
  5. Article
  6. Article
  7. Review
  8. Article
  9. Article
  10. Review
  11. Review
  12. Review
  13. Article
  14. Article
  15. Review
  16. Review
  17. Article
  18. Article
  19. Review
  20. Review
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

6 authors.

Prithvi BasuDepartment of Electrical Engineering, Texas A&M University, College Station, TX 77843, USA.
Jyoti VermaDepartment of Electrical Engineering, Texas A&M University, College Station, TX 77843, USA.
Vishnuram AbhinavDepartment of Electrical Engineering, Indian Institute of Technology Bombay, Mumbai 400076, India.ORCID 0000-0001-5115-9423
Ratneshwar Kumar RatneshDepartment of Electronics and Communication Engineering, Meerut Institute of Engineering and Technology, Meerut 250005, India.ORCID 0000-0002-3438-6541
Yogesh Kumar SinglaSchool of Engineering, Math and Technology, Navajo Technical University, Crownpoint, NM 87313, USA.ORCID 0000-0001-9484-0067
Vibhor KumarDepartment of Electrical Engineering, Texas A&M University, College Station, TX 77843, USA.ORCID 0000-0003-3186-6635

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Lithography is crucial to semiconductor manufacturing, enabling the production of smaller, more powerful electronic devices. This review explores the evolution, principles, and advancements of key lithography techniques, including extreme ultraviolet (EUV) lithography, electron beam lithography (EBL), X-ray lithography (XRL), ion beam lithography (IBL), and nanoimprint lithography (NIL). Each method is analyzed based on its working principles, resolution, resist materials, and applications. EUV lithography, with sub-10 nm resolution, is vital for extending Moore's Law, leveraging high-NA optics and chemically amplified resists. EBL and IBL enable high-precision maskless patterning for prototyping but suffer from low throughput. XRL, using synchrotron radiation, achieves deep, high-resolution features, while NIL provides a cost-effective, high-throughput method for replicating nanostructures. Alignment marks play a key role in precise layer-to-layer registration, with innovations enhancing accuracy in advanced systems. The mask fabrication process is also examined, highlighting materials like molybdenum silicide for EUV and defect mitigation strategies such as automated inspection and repair. Despite challenges in resolution, defect control, and material innovation, lithography remains indispensable in semiconductor scaling, supporting applications in integrated circuits, photonics, and MEMS/NEMS devices. Various molecular strategies, mechanisms, and molecular dynamic simulations to overcome the fundamental lithographic limits are also highlighted in detail. This review offers insights into lithography's present and future, aiding researchers in nanoscale manufacturing advancements.

Indexed as

NanostructuresNanotechnologySemiconductorselectron beam lithography (EBL)extreme UV lithographyion beam lithography (IBL)lithographynanofabricationnanoimprint lithography (NIL)nanostructureX-ray lithography (XRL)

Identifiers

PMID40243625
PMCPMC11988993

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.