Evidence map›Paper›PMID 40226223›Full record

ArticleACS applied electronic materials2025

Thermal Boundary Resistance Reduction by Interfacial Nanopatterning for GaN-on-Diamond Electronics Applications.

Xiaoyang Ji, Sai Charan Vanjari, Daniel Francis, Jerome A Cuenca, Arpit Nandi, David Cherns, Oliver A Williams, Felix Ejeckam, James W Pomeroy, Martin Kuball

Abstract read
In one paragraph

Article in ACS applied electronic materials, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 2 papers.

0numbers the graph read from it
0cells of the map it votes in
2citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

2 citing papers in PubMed.

  1. Article
  2. Recent Advances in Diamond-Capped GaN HEMTs for RF Application.Nanomaterials (Basel, Switzerland) · 2026
    Review
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

10 authors.

Xiaoyang JiCentre for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TL, U.K.
Sai Charan VanjariCentre for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TL, U.K.ORCID https://orcid.org/0000-0003-4448-4943
Daniel FrancisCentre for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TL, U.K.
Jerome A CuencaCardiff School of Physics and Astronomy, Cardiff University, Cardiff CF24 3AA, U.K.ORCID https://orcid.org/0000-0003-1370-1167
Arpit NandiCentre for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TL, U.K.ORCID https://orcid.org/0000-0003-1160-8655
David ChernsCentre for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TL, U.K.ORCID https://orcid.org/0000-0002-5419-5486
Oliver A WilliamsCardiff School of Physics and Astronomy, Cardiff University, Cardiff CF24 3AA, U.K.ORCID https://orcid.org/0000-0002-7210-3004
Felix EjeckamAkash Systems, San Francisco, California 94108, United States.
James W PomeroyCentre for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TL, U.K.
Martin KuballCentre for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TL, U.K.ORCID https://orcid.org/0000-0003-3070-1070

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

GaN high electron mobility transistors (HEMTs) on SiC substrates are the highest performing commercially available transistors for high-power, high-frequency applications. However, Joule self-heating limits the maximum areal power density, i.e., operating power is derated to ensure the lifetime of GaN-based devices. Diamond is attractive as a heat sink due to its record-high thermal conductivity combined with its high electrical resistivity. GaN-on-diamond devices have been demonstrated, bringing the diamond as close as possible to the active device area. The GaN/diamond interface, close to the channel heat source, needs to efficiently conduct high heat fluxes, but it can present a significant thermal boundary resistance (TBR). In this work, we implement nanoscale trenches between GaN and diamond to explore new strategies for reducing the effective GaN/diamond TBR (TBR

Identifiers

PMID40226223
PMCPMC11984094

What OpenQuestion holds

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LicenceCC BY
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Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.