Evidence map›Paper›PMID 40123205›Full record

ArticleSmall methods2025

Impact of Geometry on Chemical Analysis Exemplified for Photoelectron Spectroscopy of Black Silicon.

Jens U Neurohr, Anton Wittig, Hendrik Hähl, Friederike Nolle, Thomas Faidt, Samuel Grandthyll, Karin Jacobs, Michael A Klatt, Frank Müller

Abstract read
PubMed Full text at PMC Publisher
In one paragraph

Article in Small methods, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 2 papers.

0numbers the graph read from it
0cells of the map it votes in
2citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

2 citing papers in PubMed.

  1. Article
  2. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

9 authors.

Jens U NeurohrExperimental Physics and Center for Biophysics, Saarland University, Campus E2 9, 66123, Saarbrücken, Germany.ORCID https://orcid.org/0009-0001-6799-093X
Anton WittigExperimental Physics and Center for Biophysics, Saarland University, Campus E2 9, 66123, Saarbrücken, Germany.ORCID https://orcid.org/0000-0002-5498-1284
Hendrik HählExperimental Physics and Center for Biophysics, Saarland University, Campus E2 9, 66123, Saarbrücken, Germany.ORCID https://orcid.org/0000-0002-2708-0990
Friederike NolleExperimental Physics and Center for Biophysics, Saarland University, Campus E2 9, 66123, Saarbrücken, Germany.ORCID https://orcid.org/0000-0002-8270-0216
Thomas FaidtExperimental Physics and Center for Biophysics, Saarland University, Campus E2 9, 66123, Saarbrücken, Germany.ORCID https://orcid.org/0000-0003-2035-786X
Samuel GrandthyllExperimental Physics and Center for Biophysics, Saarland University, Campus E2 9, 66123, Saarbrücken, Germany.ORCID https://orcid.org/0000-0001-5715-5570
Karin JacobsExperimental Physics and Center for Biophysics, Saarland University, Campus E2 9, 66123, Saarbrücken, Germany.ORCID https://orcid.org/0000-0002-2963-2533
Michael A KlattGerman Aerospace Center (DLR), Institute for AI Safety and Security, Wilhelm-Runge-Str. 10, 89081, Ulm, Germany.ORCID https://orcid.org/0000-0002-1029-5960
Frank MüllerExperimental Physics and Center for Biophysics, Saarland University, Campus E2 9, 66123, Saarbrücken, Germany.ORCID https://orcid.org/0000-0001-8955-5317

Funding

Deutsche Forschungsgemeinschaft JA905/8Deutsche Forschungsgemeinschaft KL3391/2-2Deutsche Forschungsgemeinschaft LO418/25-1Deutsche Forschungsgemeinschaft WI5527/1-1Helmholtz Association "DataMat."Sonderforschungebereich (SFB)1027
6 · The paper itself

Abstract

For smooth surfaces, chemical composition can be readily analyzed using various spectroscopic techniques, a prominent example is X-ray photoelectron spectroscopy (XPS), where the relative proportions of the elements are mainly determined by the intensity ratio of the element-specific photoelectrons. However, this analysis becomes more complex for nanorough surfaces like black silicon (b-Si) due to the geometry's steep slopes, which mimic local variations in emission angles. In this study, this effect is explicitly quantified through an integral geometric analysis using Minkowski tensors, correlating XPS chemical data with topographical information from Atomic Force Microscopy (AFM). This approach yields reliable estimates of layer thicknesses for nanorough surfaces. For b-Si, it is found that the oxide layer is ≈50%-80% thicker than the native oxide layer on a standard Si wafer. This study underscores the significant impact of nanoscale geometries on chemical property analysis.

Indexed as

atomic force microscopy (AFM)black siliconMinkowski analysisnano‐roughnessX‐ray photoelectron spectroscopy (XPS)

Identifiers

PMID40123205
PMCPMC12285617

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.