ArticleJournal of microscopy2025
Detecting charge transfer at defects in 2D materials with electron ptychography.
Article in Journal of microscopy, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 6 papers.
What it found
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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.
The trial behind it
Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.
Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.
Who cites it
6 citing papers in PubMed.
- Detecting charge transfer at defects in 2D materials with electron ptychography.Journal of microscopy · 2025Article
- Quantifying phase magnitudes of open-source focused-probe 4D-STEM ptychography reconstructions.Journal of microscopy · 2025Article
- Ptychoscopy: a user friendly experimental design tool for ptychography.Scientific reports · 2025Article
- Phase Imaging Methods in the Scanning Transmission Electron Microscope.Nano letters · 2025Review
- Uncovering the Atomic Structure of Substitutional Platinum Dopants in MoSNano letters · 2025Article
- Ptychography at all wavelengths.Nature reviews. Methods primers · 2025Article
Corrections and comments
PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.
Authors and funding
4 authors.
Funding
Abstract
Electronic charge transfer at the atomic scale can reveal fundamental information about chemical bonding, but is far more challenging to directly image than the atomic structure. The charge density is dominated by the atomic nuclei, with bonding causing only a small perturbation. Thus detecting any change due to bonding requires a higher level of sensitivity than imaging structure and the overall charge density. Here we achieve the sensitivity required to detect charge transfer in both pristine and defected monolayer WS
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Registered trials
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