ArticleJournal of synchrotron radiation2025
Resolution enhancement on single-shot X-ray spectrometers using a detuned non-dispersive multi-crystal analyzer.
Article in Journal of synchrotron radiation, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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Abstract
This study proposes and demonstrates a simple method for improving the energy resolution in a single-shot X-ray spectrometer, which consists of a focusing mirror and a single-crystal analyzer. Two Si(220) channel-cut crystals arranged in a non-dispersive geometry are employed as the analyzer. The angular width of diffraction for the multi-crystal analyzer is reduced by detuning one of the crystals, thereby enhancing the energy resolution of the spectrometer while maintaining the energy range. A proof-of-principle experiment with 10.4 keV X-rays clearly shows a resolution enhancement by a factor of two. It was found that X-ray penetration within the crystals broadened the point-spread function on the detector, significantly impacting the energy resolution under highly detuned conditions. A long detector distance of greater than 14 m is expected to achieve a high energy resolution of 100 meV and a range of 80 eV, enabling full spectral characterization of X-ray free-electron laser radiation as well as advanced spectroscopy techniques.
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