ArticleJournal of synchrotron radiation2025
New online beam intensity synchronous monitoring system in scanning transmission X-ray microscopy.
Article in Journal of synchrotron radiation, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.
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1 citing paper in PubMed.
- Monolithic integration of SiC diode detectors into scanning X-ray microscopy optical elements for in situ beam diagnostics.Journal of synchrotron radiation · 2026Article
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16 authors.
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Abstract
The scanning transmission X-ray microscopy (STXM) platform based on synchrotron radiation has achieved nanoscale imaging with chemical sensitivity using spectro-microscopy techniques. However, the quality of STXM imaging is affected by the stability of the beam intensity. The top-up operation mode of synchrotrons to maintain a constant electron beam intensity introduces periodic fluctuations in the X-ray beam intensity, leading to notable imaging noise that decreases both contrast and precision. To address this issue, a high-speed real-time beam intensity monitoring system was designed and implemented at the BL08U1A beamline of the Shanghai Synchrotron Radiation Facility. This system utilizes an yttrium-aluminium-garnet crystal along with dual detectors having an acquisition frequency of up to 1 MHz and a synchronization error of less than 20 ns between them. This system can precisely and synchronously monitor the X-ray beam intensity variations which are used to remove noise due to electron injection from STXM images, thereby markedly improving the quality of STXM imaging.
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