ArticleACS nano2025
Scanning Thermal Microscopy Method for Self-Heating in Nonlinear Devices and Application to Filamentary Resistive Random-Access Memory.
Article in ACS nano, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.
What it found
Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.
The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.
The trial behind it
Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.
Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.
Who cites it
3 citing papers in PubMed.
- Visualizing interfacial thermal resistance in two-dimensional material-polymer composites from measurement to mechanistic understanding.Science advances · 2026Review
- Direct Thermal Imaging of Domain Wall Hot Spots in LiNbOSmall (Weinheim an der Bergstrasse, Germany) · 2026Article
- Lateral deflection-based optimization achieves sub-picometer detection limit.Microsystems & nanoengineering · 2026Article
Corrections and comments
PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.
Authors and funding
3 authors.
Funding
No grant is acknowledged in the PubMed record.
Abstract
Devices with a highly nonlinear resistance-voltage relationship are candidates for neuromorphic computing, which can be achieved by highly temperature dependent processes like ion migration. To explore the thermal properties of such devices, Scanning Thermal Microscopy (SThM) can be employed. However, due to the nonlinearity, the high resolution and quantitative method of AC-modulated SThM cannot readily be used. To this end, an extended nonequilibrium scheme for temperature measurement using SThM is proposed, with which the self-heating of nonlinear devices is studied without the need for calibrating the tip-sample contact for a specific material combination, geometry or roughness. Both a DC and an AC voltage are applied to the device, triggering a periodic temperature rise, which enables the simultaneous calculation of the tip-sample thermal resistance and the device temperature rise. The method is applied to HfO
Indexed as
Identifiers
What OpenQuestion holds
Registered trials
Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.