Evidence map›Paper›PMID 39804707›Full record

ReviewNano letters2025

Assessing Design Space for the Device-Circuit Codesign of Nonvolatile Memory-Based Compute-in-Memory Accelerators.

Ashwin Sanjay Lele, Bo Zhang, Win-San Khwa, Meng-Fan Chang

Abstract readReview
In one paragraph

Review in Nano letters, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

4 authors.

Ashwin Sanjay LeleCorporate Research, TSMC, San Jose, California 95134, United States.
Bo ZhangCorporate Research, TSMC, San Jose, California 95134, United States.ORCID 0000-0003-3603-6016
Win-San KhwaCorporate Research, TSMC, Hsinchu, 300-094, Taiwan.ORCID 0000-0002-6283-3564
Meng-Fan ChangCorporate Research, TSMC, Hsinchu, 300-094, Taiwan.ORCID 0000-0001-6905-6350

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Unprecedented penetration of artificial intelligence (AI) algorithms has brought about rapid innovations in electronic hardware, including new memory devices. Nonvolatile memory (NVM) devices offer one such attractive alternative with ∼2× density and data retention after powering off. Compute-in-memory (CIM) architectures further improve energy efficiency by fusing the computation operations with AI model storage. Electronic characteristics of NVM devices, like resistance in the two resistance states, directly affect the circuit designers' decisions and result in the varying performance of NVM-CIM chips. In this mini review, we assess the bounds on device resistances for accuracy and circuit performance to suggest recommendations to device engineers for frictionless device-circuit-system interactions. Furthermore, we review challenges in reliably programming NVM devices, followed by benchmarking recent NVM-CIM chips. Our literature review and analytical modeling reveal that a high resistance ratio and low variability are favored, and the resistance in a low resistance state is bound by accuracy and circuit performance constraints.

Indexed as

compute-in-memoryMRAMnonvolatile memoryPCMRRAM

Identifiers

PMID39804707
PMCPMC11783582

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.