← Evidence map

ArticleMicromachines2024

Application of Solution-Processed High-Entropy Metal Oxide Dielectric Layers with High Dielectric Constant and Wide Bandgap in Thin-Film Transistors.

Jun Liu et al.PubMed ↗Full text ↗Publisher ↗

No numbers read from the abstract.

1 paper cites it

2024
2025
this papercites it
Full record →Abstract, authors, funding and every citing paper · PMID 39770218