ReviewFundamental research2024
The application of multi-scale simulation in advanced electronic packaging.
Review in Fundamental research, 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.
What it found
Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.
The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.
The trial behind it
Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.
Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.
Who cites it
3 citing papers in PubMed.
- Study on warpage stress in SiP packages during reflow soldering.Scientific reports · 2026Article
- Multiscale Modeling of Thermo-Electro-Mechanical Coupling of BGA Solder Joints in Microelectronic Systems of Ruggedized Computers for Signal Integrity Analysis.Micromachines · 2025Article
- Integrated chips: An interdisciplinary evolution in the Post-Moore Era.Fundamental research · 2024Article
Corrections and comments
PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.
Authors and funding
8 authors.
Funding
No grant is acknowledged in the PubMed record.
Abstract
Electronic packaging is an essential branch of electronic engineering that aims to protect electronic, microelectronic, and nanoelectronic systems from environmental conditions. The design of electronic packaging is highly complex and requires the consideration of multi-physics phenomena, such as thermal transport, electromagnetic fields, and mechanical stress. This review presents a comprehensive overview of the multiphysics coupling of electric, magnetic, thermal, mechanical, and fluid fields, which are crucial for assessing the performance and reliability of electronic devices. The recent advancements in multi-scale simulation techniques are also systematically summarized, such as finite element methods at the macroscopic scale, molecular dynamics and density functional theory at the microscopic scale, and particularly machine learning methods for bridging different scales. Additionally, we illustrate how these methods can be applied to study various aspects of electronic packaging, such as material properties, interfacial failure, thermal management, electromigration, and stress analysis. The challenges and the potential applications of multi-scale simulation techniques in electronic packaging are also highlighted. Further, some future directions for multi-scale simulation techniques in electronic packaging are concluded for further investigation.
Indexed as
Identifiers
What OpenQuestion holds
Registered trials
Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.