Evidence map›Paper›PMID 39730544›Full record

ArticleScientific reports2024

Cation composition ratio and channel length effects on bias stress instability in amorphous InGaZnO back-end-of-line field-effect transistors.

Donguk Kim, Dayeon Lee, Wonjung Kim, Ho Jung Lee, Changwook Kim, Kwang-Hee Lee, Moonil Jung, Jee-Eun Yang, Younjin Jang, Sungjun Kim and 2 more

Abstract read
In one paragraph

Article in Scientific reports, 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

12 authors.

Donguk KimSchool of Electrical Engineering, Kookmin University, Seoul, 02707, Republic of Korea.
Dayeon LeeSchool of Electrical Engineering, Kookmin University, Seoul, 02707, Republic of Korea.
Wonjung KimSchool of Electrical Engineering, Kookmin University, Seoul, 02707, Republic of Korea.
Ho Jung LeeSchool of Electrical Engineering, Kookmin University, Seoul, 02707, Republic of Korea.
Changwook KimSchool of Electrical Engineering, Kookmin University, Seoul, 02707, Republic of Korea.
Kwang-Hee LeeSamsung Advanced Institute of Technology (SAIT), Samsung Electronics, Suwon, 16678, Gyeonggi-do, Republic of Korea.
Moonil JungSamsung Advanced Institute of Technology (SAIT), Samsung Electronics, Suwon, 16678, Gyeonggi-do, Republic of Korea.
Jee-Eun YangSamsung Advanced Institute of Technology (SAIT), Samsung Electronics, Suwon, 16678, Gyeonggi-do, Republic of Korea.
Younjin JangSamsung Advanced Institute of Technology (SAIT), Samsung Electronics, Suwon, 16678, Gyeonggi-do, Republic of Korea.
Sungjun KimDivision of Electronics and Electrical Engineering, Dongguk University, Seoul, 04620, Republic of Korea. sungjun@dongguk.edu.
Sangwook KimSamsung Advanced Institute of Technology (SAIT), Samsung Electronics, Suwon, 16678, Gyeonggi-do, Republic of Korea. nofate.kim@samsung.com.
Dae Hwan KimSchool of Electrical Engineering, Kookmin University, Seoul, 02707, Republic of Korea. drlife@kookmin.ac.kr.

Funding

National Research Foundation of Korea RS-2023-00208661
6 · The paper itself

Abstract

This study optimizes V

Identifiers

PMID39730544
PMCPMC11680911

What OpenQuestion holds

Textmetadata
LicenceCC BY-NC-ND
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.