Evidence map›Paper›PMID 39705251›Full record

ArticleJournal of synchrotron radiation2025

Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering.

Hiroo Tajiri, Shinji Kohara, Koji Kimura, Sekhar Halubai, Haruto Morimoto, Naohisa Happo, Jens R Stellhorn, Yohei Onodera, Xvsheng Qiao, Daisuke Urushihara and 4 more

Abstract read
In one paragraph

Article in Journal of synchrotron radiation, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

14 authors.

Hiroo TajiriJapan Synchrotron Radiation Research Institute, Hyogo 679-5198, Japan.ORCID 0000-0002-8457-5631
Shinji KoharaJapan Synchrotron Radiation Research Institute, Hyogo 679-5198, Japan.ORCID 0000-0001-9596-2680
Koji KimuraJapan Synchrotron Radiation Research Institute, Hyogo 679-5198, Japan.ORCID 0000-0001-5485-3672
Sekhar HalubaiJapan Synchrotron Radiation Research Institute, Hyogo 679-5198, Japan.
Haruto MorimotoDepartment of Physical Science and Engineering, Nagoya Institute of Technology, Nagoya 466-8555, Japan.
Naohisa HappoGraduate School of Information Sciences, Hiroshima City University, Hiroshima 731-3194, Japan.ORCID 0000-0003-1888-6762
Jens R StellhornCo-Creation Institute for Advanced Materials, Shimane University, Matsue 690-8504, Japan.ORCID 0000-0002-5579-6902
Yohei OnoderaCenter for Basic Research on Materials, National Institute for Materials Science, Ibaraki 305-0047, Japan.ORCID 0000-0002-3080-6991
Xvsheng QiaoState Key Laboratory of Silicon Materials & School of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, China.ORCID 0000-0002-6411-1274
Daisuke UrushiharaDivision of Advanced Ceramics, Nagoya Institute of Technology, Nagoya 466-8555, Japan.ORCID 0000-0002-2967-0337
Peidong HuInstitute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan.
Toru WakiharaInstitute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan.ORCID 0000-0002-3916-3849
Toyohiko KinoshitaJapan Synchrotron Radiation Research Institute, Hyogo 679-5198, Japan.ORCID 0000-0002-8030-0796
Koichi HayashiJapan Synchrotron Radiation Research Institute, Hyogo 679-5198, Japan.ORCID 0000-0002-8782-4293

Funding

Japan Society for the Promotion of Science 20H05878Japan Society for the Promotion of Science 20H05880Japan Society for the Promotion of Science 20H05881
6 · The paper itself

Abstract

To tackle disorder in crystals and short- and intermediate-range order in amorphous materials, such as glass, we developed a carry-in diffractometer to utilise X-ray fluorescence holography (XFH) and anomalous X-ray scattering (AXS), facilitating element-specific analyses with atomic resolution using the wavelength tunability of a synchrotron X-ray source. Our diffractometer unifies XFH and AXS configurations to determine the crystal orientation via diffractometry. In particular, XFH was realised even for a crystal with blurred emission lines by a standing wave in a hologram, and high-throughput AXS with sufficient count statistics and energy resolution was achieved using three multi-array detectors with crystal analysers. These features increase tractable targets by XFH and AXS, which have novel functionalities.

Indexed as

anomalous X-ray scatteringcarry-in equipmentelement-specific measurementsX-ray diffractometersX-ray fluorescence holography

Identifiers

PMID39705251
PMCPMC11708849

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.