ArticleNanophotonics (Berlin, Germany)2024
Deterministic reflection contrast ellipsometry for thick multilayer two-dimensional heterostructures.
Article in Nanophotonics (Berlin, Germany), 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.
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Who cites it
3 citing papers in PubMed.
- Materials Informatics Framework for Accelerated Discovery of High-Refractive-Index 2D Materials.ACS nano · 2026Article
- Bridging the scalability gap in van der Waals light guiding with high refractive index MoTeNanophotonics (Berlin, Germany) · 2025Article
- Editorial on special issue "Metamaterials and Plasmonics in Asia".Nanophotonics (Berlin, Germany) · 2024Article
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3 authors.
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Abstract
Optical spectroscopy is a powerful tool for characterizing the properties of two-dimensional (2D) heterostructures. However, extracting the permittivity information of each 2D layer in optically thick heterostructures is challenging because of interference. To accurately measure the optical permittivity of each 2D layer in a heterostructure or on a substrate with a thick insulating spacer, such as oxides, we propose deterministic reflection contrast ellipsometry (DRCE). Our DRCE method has two advantages over conventional techniques. It deterministically measures the optical permittivity of 2D materials using only the measured reflection spectra of the heterostructure, rather than dispersion fitting as in spectroscopic ellipsometry. Additionally, the DRCE is free of excitonic energy errors in reflection-contrast spectroscopy. We believe that DRCE will enable accurate and rapid characterization of 2D materials.
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