ArticleACS applied electronic materials2024
Determination of Imprint Effects in Ferroelectrics from the Quantified Phase and Amplitude Response.
Article in ACS applied electronic materials, 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 4 papers.
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Who cites it
4 citing papers in PubMed.
- Quantifying Magnetic Anisotropy of Ferroelectric Fe(II) Square-Pyramidal Systems Using Torque Magnetometry.Advanced science (Weinheim, Baden-Wurttemberg, Germany) · 2026Article
- Stabilizing Metastable Rare-Earth Ferrites on (111) Platinum via an Iron Oxide Interlayer.ACS applied electronic materials · 2026Article
- Subsecond optically controlled domain switching in freestanding ferroelectric BaTiONature communications · 2025Article
- Evaluation of Physical Properties of Ti-Doped BiFeOMaterials (Basel, Switzerland) · 2025Article
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Authors and funding
9 authors.
Funding
No grant is acknowledged in the PubMed record.
Abstract
Piezoresponse force microscopy (PFM) is a robust characterization technique to explore ferroelectric properties at the nanoscale. However, the PFM signal can lead to misinterpretation of results due to the dominant electrostatic interaction between the tip and the sample. In this work, a detailed calibration process is presented and a procedure to identify the parasitic phase offset is demonstrated. To obtain artifact-free phase-amplitude loops, a methodology is developed by combining the outcomes from switching spectroscopy-PFM (SS-PFM) and Kelvin probe force microscopy (KPFM). It is demonstrated that the phase and amplitude loops obtained from SS-PFM at a specific read voltage, ascertained from the surface potential by KPFM, can convey accurate electromechanical information. These methodologies are applied to quantify the imprint voltage in BaTiO
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Registered trials
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