Evidence map›Paper›PMID 39300960›Full record

ArticleMicroscopy (Oxford, England)2025

Surface sensitivity of atomic-resolution secondary electron imaging.

Koh Saitoh, Teppei Oyobe, Keisuke Igarashi, Takeshi Sato, Hiroaki Matsumoto, Hiromi Inada, Takahiko Endo, Yasumitsu Miyata, Rei Usami, Taishi Takenobu

Abstract read
PubMed Full text at PMC Publisher
In one paragraph

Article in Microscopy (Oxford, England), 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Discerning single atoms on TiONature communications · 2025
    Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

10 authors.

Koh SaitohInstitute of Materials and Systems for Sustainability, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan.
Teppei OyobeDepartment of Applied Physics, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan.
Keisuke IgarashiCore Technology & Solutions Business Group, Hitachi High-Tech Corporation, 882 Ichige, Hitachinaka, Ibaraki 312-8504, Japan.
Takeshi SatoCore Technology & Solutions Business Group, Hitachi High-Tech Corporation, 882 Ichige, Hitachinaka, Ibaraki 312-8504, Japan.
Hiroaki MatsumotoCore Technology & Solutions Business Group, Hitachi High-Tech Corporation, 882 Ichige, Hitachinaka, Ibaraki 312-8504, Japan.
Hiromi InadaCore Technology & Solutions Business Group, Hitachi High-Tech Corporation, 882 Ichige, Hitachinaka, Ibaraki 312-8504, Japan.
Takahiko EndoDepartment of Physics, Tokyo Metropolitan University, Hachioji, Tokyo 192-0397, Japan.
Yasumitsu MiyataDepartment of Physics, Tokyo Metropolitan University, Hachioji, Tokyo 192-0397, Japan.
Rei UsamiDepartment of Applied Physics, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan.
Taishi TakenobuDepartment of Applied Physics, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan.

Funding

Core Research for Evolutional Science and Technology JPMJCR23A4Japan Society for the Promotion of Science JP21H05232 JP21H05234 JP22H00280 JP22H04590 JP22H04957
6 · The paper itself

Abstract

The surface sensitivity of high-resolution secondary electron (SE) imaging is examined using twisted bilayers of MoS2 stacked at an angle of 30°. High-resolution SE images of the twisted bilayer MoS2 show a honeycomb structure composed of Mo and S atoms, elucidating the monolayer structure of MoS2. Simultaneously captured annular dark-field scanning transmission electron microscope images from the same region show the projected structure of the two layers. That is, the SE images from the bilayer MoS2 selectively visualize the surface monolayer. It is noted that the SE yields from the surface monolayer are approximately three times higher than those from the second monolayer, likely attributable to attenuation when SEs emitted from the second layer traverse the surface layer. The surface sensitivity of high-resolution SE imaging is examined using twisted bilayers of MoS2 stacked at an angle of 30°. It was found that the SE images of the MoS2 bilayer visualize the surface monolayer approximately three times more intensely than the second monolayer.

Indexed as

atomic layer materialsatomic-resolution scanning electron microscopysecondary electron imagingsurface sensitivity

Identifiers

PMID39300960
PMCPMC11781273

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.