ArticleOptics letters2024
Foundry manufacturing of octave-spanning microcombs.
Article in Optics letters, 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 6 papers.
What it found
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The trial behind it
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Who cites it
6 citing papers in PubMed.
- Article
- Microring Resonator Dispersion Metrology With Neural Networks.Nanophotonics (Berlin, Germany) · 2026Article
- Article
- Power-efficient ultra-broadband soliton microcombs in resonantly-coupled microresonators.Light, science & applications · 2026Article
- Low-loss silicon nitride Kerr-microresonators fabricated with metallic etch masks via metal lift-off.Scientific reports · 2026Article
- Amorphous metal oxide mixtures for high-Communications physics · 2026Article
Corrections and comments
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Authors and funding
4 authors.
Funding
Abstract
Soliton microcombs provide a chip-based, octave-spanning source for self-referencing and optical metrology. We use a silicon nitride integrated photonics foundry to manufacture 280 single-chip solutions of octave-spanning microcombs on a wafer. By group-velocity dispersion (GVD) engineering with the waveguide cross section, we shape the soliton spectrum for dispersive-wave spectral enhancements at the frequencies for f-2f self-referencing. Moreover, we demonstrate the other considerations, including models for soliton spectrum design, ultra-broadband resonator external coupling, low-loss edge couplers, and the nonlinear self-interactions of few-cycle solitons. To cover the fabrication tolerance, we systematically scan 336 parameter sets of resonator width and radius, ensuring at least one device on each chip can yield an octave-spanning comb with an electronically detectable carrier-envelope offset frequency, which has been supported by our experiment. Our design and testing process permit highly repeatable creation of single-chip solutions of soliton microcombs optimized for pump operation ∼100 mW and high comb mode power for f-2f detection, which is the central component of a compact microsystem for optical metrology.
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Registered trials
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