ArticleThe journal of physical chemistry. C, Nanomaterials and interfaces2024
Soft X-ray Induced Radiation Damage in Dip-and-Pull Photon Absorption and Photoelectron Emission Experiments.
Article in The journal of physical chemistry. C, Nanomaterials and interfaces, 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.
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3 citing papers in PubMed.
- Radiolysis study on PVDF binder - how does it affect the X-ray photoelectron spectroscopy characterisation of phospho-olivine electrodes?EES batteries · 2026Article
- Direct Experimental Evidence of Transient AuJournal of the American Chemical Society · 2026Article
- Methodological insights into the dip-and-pull X-ray photoelectron spectroscopy technique: analysing electrochemical interfaces under in situ/operando conditions.Journal of synchrotron radiation · 2026Article
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4 authors.
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Abstract
X-ray irradiation can induce chemical reactions on surfaces. In X-ray spectroscopic experiments, such reactions may result in spectrum distortion and are termed radiation damage. In this study, we investigate the X-ray-induced chemical reaction at the partially oxidized copper surface in the settings of the dip-and-pull experiment, a method that generates liquid-solid interfaces for in situ X-ray photoelectron spectroscopy (XPS) studies. In dense water vapor resembling the predipping condition, a series of time-elapsed X-ray absorption spectra acquired in total electron yield mode (TEY-XAS) shows that X-ray exposure causes copper reduction, which follows first-order kinetics and occurs only at the surface shallower than the probing depth of TEY-XAS. At the solid-water interface created by the dip-and-pull method, the chemical reduction of surface copper is also identified by XPS. We conclude that the reduction is driven by the product of water radiolysis, where the reducing solvated electron prevails against the oxidizing OH radical and results in an overall reduction of surface copper ions.
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