Machine Learning-Based Classification of Soil Parent Materials Using Elemental Concentration and Vis-NIR Data.

In soil science, the allocation of soil samples to their respective origins holds paramount significance, as it serves as a crucial investigative tool. In recent times, with the increasing use of proximal sensing and advancements in machine-learning techniques, new approaches have accompanied these developments, enhancing the effectiveness of soil utilization in soil science. This study investigates soil classification based on four parent materials. For this purpose, a total of 59 soil samples were collected from 12 profiles and the vicinity of each profile at a depth of 0-30 cm. Surface soil samples were analyzed for elemental concentrations using X-Ray fluorescence (XRF) and inductively coupled plasma-optical emission spectrometry (ICP-OES) and soil spectra using a visible near-infrared (Vis-NIR) spectrometer. Soil samples collected from soil profiles (12 soil samples) and surface (47 soil samples) were used to classify parent materials using machine learning-based algorithms such as Support Vector Machine (SVM), Ensemble Subspace k-Near Neighbor (ESKNN), and Ensemble Bagged Trees (EBTs). Additionally, as a validation of the classification techniques, the dataset was subjected to five-fold cross-validation and independent sample set splitting (80% calibration and 20% validation). Evaluation metrics such as accuracy, F score, and G mean were used to evaluate prediction performance. Depending on the dataset and algorithm used, the classification success rates varied between 70% and 100%. Overall, the ESKNN (99%) produced better results than other classification methods. Additionally, Relief algorithms were employed to identify key variables for each dataset (ICP-OES: CaO, Fe