Evidence map›Paper›PMID 39164348›Full record

ArticleScientific reports2024

Defect detection of printed circuit board assembly based on YOLOv5.

Minghui Shen, Yujie Liu, Jing Chen, Kangqi Ye, Heyuan Gao, Jie Che, Qingyang Wang, Hao He, Jian Liu, Yan Wang and 1 more

Abstract read
In one paragraph

Article in Scientific reports, 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 6 papers.

0numbers the graph read from it
0cells of the map it votes in
6citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

6 citing papers in PubMed.

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4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

11 authors.

Minghui ShenSchool of Computing and Information Technology, Hefei University of Technology, Xuancheng, 242000, China.
Yujie LiuSchool of Computing and Information Technology, Hefei University of Technology, Xuancheng, 242000, China.
Jing ChenSchool of Computing and Information Technology, Hefei University of Technology, Xuancheng, 242000, China.
Kangqi YeSchool of Computing and Information Technology, Hefei University of Technology, Xuancheng, 242000, China.
Heyuan GaoSchool of Computing and Information Technology, Hefei University of Technology, Xuancheng, 242000, China.
Jie CheSchool of Computing and Information Technology, Hefei University of Technology, Xuancheng, 242000, China.
Qingyang WangSchool of Reading, Nanjing University of Information Science and Technology, Nanjing, 210044, China.
Hao HeSchool of Computer and Software Engineering, Anhui Institute of Information Technology, Wuhu, 241100, China. dmz0504@126.com.
Jian LiuSchool of Computing and Information Technology, Hefei University of Technology, Xuancheng, 242000, China. jianliu@hfut.edu.cn.
Yan WangSchool of Computer and Software Engineering, Anhui Institute of Information Technology, Wuhu, 241100, China.
Ye JiangSchool of Computing and Information Technology, Hefei University of Technology, Xuancheng, 242000, China.

Funding

National Natural Science Foundation of China 61703306National Natural Science Foundation of China 61906057National Natural Science Foundation of China No. JZ2019GJQN0385Natural Science Foundation of Anhui Province 2308085QF227Natural Science Research Project of Colleges and Universities in Anhui Province No.2022AH051889Program B of Academic Newcomer Promotion Plan JZ2022HGTB0274
6 · The paper itself

Abstract

Detection of printed circuit board assembly (PCBA) defects is crucial for improving the efficiency of PCBA manufacturing. This paper proposes PCBA-YOLO, a YOLOv5-based method that can effectively increase the accuracy of PCBA defect detection. First, the spatial pyramid pooling module with cross-stage partial structure is replaced in the neck network of YOLOv5 to capture the resolution features at multiple scales. Second, large kernel convolution is introduced in the backbone network to obtain larger effective receptive fields while reducing computational overhead. Finally, an SIoU loss function that considers the angular cost is utilized to enhance the convergence speed of the model. In addition, an assembled PCBA defect detection dataset named PCBA-DET is created in this paper, containing the corresponding defect categories and annotations of defect locations. The experimental results on the PCB defect dataset demonstrate that the improved method has lower loss values and higher accuracy. Evaluated on the PCBA-DET dataset, the mean average precision reaches 97.3

Identifiers

PMID39164348
PMCPMC11335752

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.