Evidence map›Paper›PMID 38998423›Full record

ArticleMaterials (Basel, Switzerland)2024

Electronic Properties of Group-III Nitride Semiconductors and Device Structures Probed by THz Optical Hall Effect.

Nerijus Armakavicius, Philipp Kühne, Alexis Papamichail, Hengfang Zhang, Sean Knight, Axel Persson, Vallery Stanishev, Jr-Tai Chen, Plamen Paskov, Mathias Schubert and 1 more

Abstract read
In one paragraph

Article in Materials (Basel, Switzerland), 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

11 authors.

Nerijus ArmakaviciusCenter for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden.ORCID 0000-0002-6363-4962
Philipp KühneCenter for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden.ORCID 0000-0002-8827-7404
Alexis PapamichailCenter for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden.ORCID 0000-0003-4902-5383
Hengfang ZhangCenter for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden.ORCID 0000-0002-1739-1656
Sean KnightCenter for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden.ORCID 0000-0002-2758-6967
Axel PerssonCenter for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden.ORCID 0000-0002-0399-8369
Vallery StanishevCenter for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden.ORCID 0000-0002-7626-1181
Jr-Tai ChenCenter for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden.ORCID 0000-0003-3943-0000
Plamen PaskovCenter for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden.ORCID 0000-0003-2602-1523
Mathias SchubertCenter for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden.ORCID 0000-0001-6238-663X
Vanya DarakchievaCenter for III-Nitride Technology (C3NiT-Janzén), Linköping University, 581 83 Linköping, Sweden.ORCID 0000-0002-8112-7411

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Group-III nitrides have transformed solid-state lighting and are strategically positioned to revolutionize high-power and high-frequency electronics. To drive this development forward, a deep understanding of fundamental material properties, such as charge carrier behavior, is essential and can also unveil new and unforeseen applications. This underscores the necessity for novel characterization tools to study group-III nitride materials and devices. The optical Hall effect (OHE) emerges as a contactless method for exploring the transport and electronic properties of semiconductor materials, simultaneously offering insights into their dielectric function. This non-destructive technique employs spectroscopic ellipsometry at long wavelengths in the presence of a magnetic field and provides quantitative information on the charge carrier density, sign, mobility, and effective mass of individual layers in multilayer structures and bulk materials. In this paper, we explore the use of terahertz (THz) OHE to study the charge carrier properties in group-III nitride heterostructures and bulk material. Examples include graded AlGaN channel high-electron-mobility transistor (HEMT) structures for high-linearity devices, highlighting the different grading profiles and their impact on the two-dimensional electron gas (2DEG) properties. Next, we demonstrate the sensitivity of the THz OHE to distinguish the 2DEG anisotropic mobility parameters in N-polar GaN/AlGaN HEMTs and show that this anisotropy is induced by the step-like surface morphology. Finally, we present the temperature-dependent results on the charge carrier properties of 2DEG and bulk electrons in GaN with a focus on the effective mass parameter and review the effective mass parameters reported in the literature. These studies showcase the capabilities of the THz OHE for advancing the understanding and development of group-III materials and devices.

Indexed as

aluminum gallium nitridealuminum nitrideelectrical propertiesfree charge carriersgallium nitridegroup-III nitridesHEMThigh-electron-mobility transistoroptical Hall effectterahertz

Identifiers

PMID38998423
PMCPMC11243707

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Read underepoch 390

Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.