ReviewThe journal of physical chemistry. C, Nanomaterials and interfaces2024
Pulsed Force Kelvin Probe Force Microscopy-A New Type of Kelvin Probe Force Microscopy under Ambient Conditions.
Review in The journal of physical chemistry. C, Nanomaterials and interfaces, 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 6 papers.
What it found
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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.
The trial behind it
Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.
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Who cites it
6 citing papers in PubMed.
- Correlative SEM-AFM Characterization of 2D Materials: From Sequential Measurements to In-Situ Multimodal Platforms.Nanomaterials (Basel, Switzerland) · 2026Review
- Kelvin Probe Force Microscopy in Bionanotechnology: Current Advances and Future Perspectives.Advanced materials (Deerfield Beach, Fla.) · 2026Review
- Spectroscopic and Electrical Insights into Humidity-Induced Modifications of Graphene Structures.ACS omega · 2026Article
- Integrating KPFM Characterisation, COMSOL Multiphysics Simulation and Physics-Informed cVAE for Multi-Polymer Triboelectric Nanogenerator Optimisation.Materials (Basel, Switzerland) · 2026Article
- Vacuum-Evaporated, Lead-Free RbYbIAdvanced materials (Deerfield Beach, Fla.) · 2026Article
- Novel Bioconjugate Materials: Synthesis, Characterization and Medical Applications.Advanced healthcare materials · 2025Review
Corrections and comments
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Authors and funding
3 authors.
Funding
No grant is acknowledged in the PubMed record.
Abstract
Kelvin probe force microscopy (KPFM) is an increasingly popular scanning probe microscopy technique used for nanoscale imaging of surface potential for various materials, such as metals, semiconductors, biological samples, and photovoltaics, to reveal their surface work function and/or local accumulation of charges. This featured review outlines the operation principles and applications of KPFM, including several typical commercially available variants. We highlight the significance of surface potential measurements, present the details of the method operation, and discuss the causes of the limitation on spatial resolution. Then, we present the pulsed force Kelvin probe force microscopy (PF-KPFM) as an innovative improvement to KPFM, which provides an enhanced spatial resolution of <10 nm under ambient conditions. PF-KPFM is promising for the characterization of heterogeneous materials with spatial variations of electrical properties. It will be especially instrumental for investigating emerging perovskite photovoltaics, heterogeneous catalysts, 2D materials, and ferroelectric materials, among others.
Identifiers
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Registered trials
Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.