Evidence map›Paper›PMID 38669276›Full record

ArticlePloS one2024

Designing process and analysis of a new SOI-MESFET structure with enhanced DC and RF characteristics for high-frequency and high-power applications.

Ahmad Ghiasi, Lewis Nkenyereye, Fawwaz Hazzazi, Muhammad Akmal Chaudhary, Maher Assaad, Abbas Rezaei

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In one paragraph

Article in PloS one, 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

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0cells of the map it votes in
0citing papers in PubMed
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1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

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Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

6 authors.

Ahmad GhiasiDepartment of Electrical Engineering, Kermanshah University of Technology, Kermanshah, Iran.ORCID 0000-0003-0539-6107
Lewis NkenyereyeDepartment of Computer & Information Security, Sejong University, Seoul, Korea.
Fawwaz HazzaziDepartment of Electrical Engineering, College of Engineering in Al-Kharj, Prince Sattam bin Abdulaziz University, AlKharj, Saudi Arabia.
Muhammad Akmal ChaudharyDepartment of Electrical and Computer Engineering, Ajman University, Ajman, United Arab Emirates.ORCID 0000-0001-6063-3377
Maher AssaadDepartment of Electrical and Computer Engineering, Ajman University, Ajman, United Arab Emirates.
Abbas RezaeiDepartment of Electrical Engineering, Kermanshah University of Technology, Kermanshah, Iran.

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

This research introduces a new designing process and analysis of an innovative Silicon-on-Insulator Metal-Semiconductor Field-Effect (SOI MESFET) structure that demonstrates improved DC and RF characteristics. The design incorporates several modifications to control and reduce the electric field concentration within the channel. These modifications include relocating the transistor channel to sub-regions near the source and drain, adjusting the position of the gate electrode closer to the source, introducing an aluminum layer beneath the channel, and integrating an oxide layer adjacent to the gate. The results show that the AlOx-MESFET configuration exhibits a remarkable increase of 128% in breakdown voltage and 156% in peak power. Furthermore, due to enhanced conductivity and a significant reduction in gate-drain capacitance, there is a notable improvement of 53% in the cut-off frequency and a 28% increase in the maximum oscillation frequency. Additionally, the current gain experiences a boost of 15%. The improved breakdown voltage and peak power make it suitable for applications requiring robust performance under high voltage and power conditions. The increased maximum oscillation frequency and cut-off frequency make it ideal for high-frequency applications where fast signal processing is crucial. Moreover, the enhanced current gain ensures efficient amplification of signals. The introduced SOI MESFET structure with its modifications offers significant improvements in various performance metrics. It provides high oscillation frequency, better breakdown voltage and good cut-off frequency, and current gain compared to the traditional designs. These enhancements make it a highly desirable choice for applications that demand high-frequency and high-power capabilities.

Indexed as

Equipment DesignSiliconElectric ConductivityElectric Power SuppliesMetalsSemiconductorsTransistors, ElectronicMetalsSilicon

Identifiers

PMID38669276
PMCPMC11051584

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.