ArticleJournal of applied crystallography2024
Millisecond X-ray reflectometry and neural network analysis: unveiling fast processes in spin coating.
Article in Journal of applied crystallography, 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 4 papers.
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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.
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Who cites it
4 citing papers in PubMed.
- Elliptical neutron-focusing supermirrors with Ni-P-plated Al-Si alloy substrates for multi-incident-angle neutron reflectometry.Journal of applied crystallography · 2026Article
- Microsecond X-ray reflectometry.Journal of applied crystallography · 2026Article
- Towards machine-learning-based on-the-fly analysis of neutron reflectometry.Journal of applied crystallography · 2026Article
- Fast and reliable probabilistic reflectometry inversion with prior-amortized neural posterior estimation.Science advances · 2025Article
Corrections and comments
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Authors and funding
6 authors.
Funding
No grant is acknowledged in the PubMed record.
Abstract
X-ray reflectometry (XRR) is a powerful tool for probing the structural characteristics of nanoscale films and layered structures, which is an important field of nanotechnology and is often used in semiconductor and optics manufacturing. This study introduces a novel approach for conducting quantitative high-resolution millisecond monochromatic XRR measurements. This is an order of magnitude faster than in previously published work. Quick XRR (qXRR) enables real time and
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Registered trials
Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.