ArticleJournal of applied crystallography2024
Simulations of dislocation contrast in dark-field X-ray microscopy.
Article in Journal of applied crystallography, 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.
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Who cites it
3 citing papers in PubMed.
- Quantifying resolution in pink-beam dark-field X-ray microscopy: experiments and simulations.Journal of applied crystallography · 2026Article
- Advances in artificial intelligence-based approaches to enhance dark field X-ray microscopy analysis.MRS communications · 2026Review
- Individual dislocation identification in dark-field X-ray microscopy.Journal of applied crystallography · 2025Article
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Authors and funding
6 authors.
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Abstract
Dark-field X-ray microscopy (DFXM) is a full-field imaging technique that non-destructively maps the structure and local strain inside deeply embedded crystalline elements in three dimensions. In DFXM, an objective lens is placed along the diffracted beam to generate a magnified projection image of the local diffracted volume. This work explores contrast methods and optimizes the DFXM setup specifically for the case of mapping dislocations. Forward projections of detector images are generated using two complementary simulation tools based on geometrical optics and wavefront propagation, respectively. Weak and strong beam contrast and the mapping of strain components are studied. The feasibility of observing dislocations in a wall is elucidated as a function of the distance between neighbouring dislocations and the spatial resolution. Dislocation studies should be feasible with energy band widths of 10
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