Evidence map›Paper›PMID 38585374›Full record

ArticleCrystal growth & design2024

Selective Growth of GaP Crystals on CMOS-Compatible Si Nanotip Wafers by Gas Source Molecular Beam Epitaxy.

Navid Kafi, Songdan Kang, Christian Golz, Adriana Rodrigues-Weisensee, Luca Persichetti, Diana Ryzhak, Giovanni Capellini, Davide Spirito, Martin Schmidbauer, Albert Kwasniewski and 3 more

Abstract read
In one paragraph

Article in Crystal growth & design, 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

13 authors.

Navid KafiInstitut für Physik, Humboldt Universität zu Berlin, 12489 Berlin, Germany.
Songdan KangInstitut für Physik, Humboldt Universität zu Berlin, 12489 Berlin, Germany.
Christian GolzInstitut für Physik, Humboldt Universität zu Berlin, 12489 Berlin, Germany.
Adriana Rodrigues-WeisenseeInstitut für Physik, Humboldt Universität zu Berlin, 12489 Berlin, Germany.
Luca PersichettiDipartimento di Fisica, Università di Roma Tor Vergata, 00133 Roma, Italy.
Diana RyzhakIHP-Leibniz Institut für Innovative Mikroelektronik, Im Technologiepark 25, 15236 Frankfurt (Oder), Germany.
Giovanni CapelliniIHP-Leibniz Institut für Innovative Mikroelektronik, Im Technologiepark 25, 15236 Frankfurt (Oder), Germany.ORCID https://orcid.org/0000-0002-5169-2823
Davide SpiritoIHP-Leibniz Institut für Innovative Mikroelektronik, Im Technologiepark 25, 15236 Frankfurt (Oder), Germany.ORCID https://orcid.org/0000-0002-6074-957X
Martin SchmidbauerLeibniz Institut für Kristallzüchtung, Max-Born Str.2, 12489 Berlin, Germany.
Albert KwasniewskiLeibniz Institut für Kristallzüchtung, Max-Born Str.2, 12489 Berlin, Germany.
Carsten NetzelFerdinand-Braun-Institut gGmbH, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Str. 4, 12489 Berlin, Germany.
Oliver SkibitzkiIHP-Leibniz Institut für Innovative Mikroelektronik, Im Technologiepark 25, 15236 Frankfurt (Oder), Germany.
Fariba HatamiInstitut für Physik, Humboldt Universität zu Berlin, 12489 Berlin, Germany.ORCID https://orcid.org/0000-0001-8033-3873

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Gallium phosphide (GaP) is a III-V semiconductor with remarkable optoelectronic properties, and it has almost the same lattice constant as silicon (Si). However, to date, the monolithic and large-scale integration of GaP devices with silicon remains challenging. In this study, we present a nanoheteroepitaxy approach using gas-source molecular-beam epitaxy for selective growth of GaP islands on Si nanotips, which were fabricated using complementary metal-oxide semiconductor (CMOS) technology on a 200 mm n-type Si(001) wafer. Our results show that GaP islands with sizes on the order of hundreds of nanometers can be successfully grown on CMOS-compatible wafers. These islands exhibit a zinc-blende phase and possess optoelectronic properties similar to those of a high-quality epitaxial GaP layer. This result marks a notable advancement in the seamless integration of GaP-based devices with high scalability into Si nanotechnology and integrated optoelectronics.

Identifiers

PMID38585374
PMCPMC10995952

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Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.