Evidence map›Paper›PMID 38553560›Full record

ArticleScientific reports2024

Core-insulator embedded nanosheet field-effect transistor for suppressing device-to-device variations.

Donghwi Son, Hyunwoo Lee, Hyunsoo Kim, Jae-Hyuk Ahn, Sungho Kim

Abstract read
In one paragraph

Article in Scientific reports, 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

5 authors.

Donghwi Son *Department of Electrical Engineering, Sejong University, Seoul, 05006, Korea.
Hyunwoo Lee *Department of Electrical Engineering, Sejong University, Seoul, 05006, Korea.
Hyunsoo KimDepartment of Electrical Engineering, Sejong University, Seoul, 05006, Korea.
Jae-Hyuk AhnDepartment of Electronics Engineering, Chungnam National University, Daejeon, 34134, Korea. jaehyuk@cnu.ac.kr.
Sungho KimDepartment of Electronic and Electrical Engineering, Ewha Womans University, Seoul, 03760, Korea. sunghok@ewha.ac.kr.

Funding

National Research Foundation of Korea 2019R1A2C1002491National Research Foundation of Korea 2023R1A2C2003666
6 · The paper itself

Abstract

Nanosheet field-effect transistors (NSFETs) have attracted considerable attention for their potential to achieve improved performance and energy efficiency compared to traditional FinFETs. Here, we present a comprehensive investigation of core-insulator-embedded nanosheet field-effect transistors (C-NSFETs), focusing on their improved performance and device-to-device (D2D) variability compared to conventional NSFETs through three-dimensional device simulations. The C-NSFETs exhibit enhanced direct-current (DC) performance, characterized by a steeper subthreshold slope and reduced off-current, indicating better gate electrostatic controllability. Furthermore, the structural design of C-NSFETs enables to demonstrate a notable resilience against D2D variations in nanosheet thickness and doping concentration. In addition, we investigate the effects of interface traps in C-NSFETs, emphasizing the importance of thermal oxidation processes in the formation of core-insulating layers to maintain optimal device performance.

Identifiers

PMID38553560
PMCPMC10980685

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.