Evidence map›Paper›PMID 38542623›Full record

ReviewMicromachines2024

Delamination of Plasticized Devices in Dynamic Service Environments.

Wenchao Tian, Xuyang Chen, Guoguang Zhang, Yuanming Chen, Jijun Luo

Open access · goldAbstract readReview
In one paragraph

Review in Micromachines, 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.

0numbers the graph read from it
0cells of the map it votes in
3citing papers in PubMed
2.0field-weighted citation impact, top 14% of its field
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

3 citing papers in PubMed, 11 citations in OpenAlex.

  1. Review
  2. Article
  3. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

5 authors at 1 institution in 1 country.

Wenchao TianKey Laboratory of Electronic Equipment Structure Design (MOE), School of Mechano-Electronic Engineering, Xidian University, Xi'an 710071, China.
Xuyang ChenGuangzhou Research Institute, Xidian University, Guangzhou 510000, China.
Guoguang ZhangFoshan Blue Rocket Electronics Co., Ltd., Foshan 528000, China.
Yuanming ChenSharetek Industrial Equipment Co., Ltd., Shanghai 201109, China.
Jijun LuoFoshan Blue Rocket Electronics Co., Ltd., Foshan 528000, China.
Xidian University · CN

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

With the continuous development of advanced packaging technology in heterogeneous semiconductor integration, the delamination failure problem in a dynamic service environment has gradually become a key factor limiting the reliability of packaging devices. In this paper, the delamination failure mechanism of polymer-based packaging devices is clarified by summarizing the relevant literature and the latest research solutions are proposed. The results show that, at the microscopic scale, thermal stress and moisture damage are still the two main mechanisms of two-phase interface failure of encapsulation devices. Additionally, the application of emerging technologies such as RDL structure modification and self-healing polymers can significantly improve the thermal stress state of encapsulation devices and enhance their moisture resistance, which can improve the anti-delamination reliability of polymer-based encapsulation devices. In addition, this paper provides theoretical support for subsequent research and optimization of polymer-based packages by summarizing the microscopic failure mechanism of delamination at the two-phase interface and introducing the latest solutions.

Indexed as

block copolymerconjugated polymerdelaminationfillersmoistureRDLthermal stress

Identifiers

PMID38542623
PMCPMC10972266
OpenAlexW4392644771

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.