Evidence map›Paper›PMID 38499534›Full record

ArticleNature communications2024

Button shear testing for adhesion measurements of 2D materials.

Josef Schätz, Navin Nayi, Jonas Weber, Christoph Metzke, Sebastian Lukas, Jürgen Walter, Tim Schaffus, Fabian Streb, Eros Reato, Agata Piacentini and 6 more

Open access · goldAbstract read
In one paragraph

Article in Nature communications, 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.

0numbers the graph read from it
0cells of the map it votes in
3citing papers in PubMed
1.9field-weighted citation impact, top 11% of its field
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

3 citing papers in PubMed, 16 citations in OpenAlex.

  1. Article
  2. Article
  3. Advances in Plasma and Laser Engineering.Materials (Basel, Switzerland) · 2024
    Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

16 authors at 6 institutions in 2 countries.

Josef SchätzInfineon Technologies AG, Wernerwerkstraße 2, 93049, Regensburg, Germany.ORCID http://orcid.org/0000-0002-4886-804X
Navin NayiInfineon Technologies AG, Wernerwerkstraße 2, 93049, Regensburg, Germany.
Jonas WeberDepartment of Electrical Engineering and Media Technology, Deggendorf Institute of Technology, Dieter-Görlitz-Platz 1, 94469, Deggendorf, Germany.ORCID http://orcid.org/0000-0002-3261-0407
Christoph MetzkeDepartment of Electrical Engineering and Media Technology, Deggendorf Institute of Technology, Dieter-Görlitz-Platz 1, 94469, Deggendorf, Germany.ORCID http://orcid.org/0000-0002-5880-6686
Sebastian LukasChair of Electronic Devices, RWTH Aachen University, Otto-Blumenthal-Str. 25, 52074, Aachen, Germany.ORCID http://orcid.org/0000-0002-8062-2832
Jürgen WalterInfineon Technologies AG, Wernerwerkstraße 2, 93049, Regensburg, Germany.
Tim SchaffusInfineon Technologies AG, Wernerwerkstraße 2, 93049, Regensburg, Germany.
Fabian StrebInfineon Technologies AG, Wernerwerkstraße 2, 93049, Regensburg, Germany.ORCID http://orcid.org/0000-0002-2011-4334
Eros ReatoChair of Electronic Devices, RWTH Aachen University, Otto-Blumenthal-Str. 25, 52074, Aachen, Germany.
Agata PiacentiniChair of Electronic Devices, RWTH Aachen University, Otto-Blumenthal-Str. 25, 52074, Aachen, Germany.
Annika GrundmannCompound Semiconductor Technology, RWTH Aachen University, Sommerfeldstr. 18, 52074, Aachen, Germany.
Holger KalischCompound Semiconductor Technology, RWTH Aachen University, Sommerfeldstr. 18, 52074, Aachen, Germany.
Michael HeukenCompound Semiconductor Technology, RWTH Aachen University, Sommerfeldstr. 18, 52074, Aachen, Germany.
Andrei VescanCompound Semiconductor Technology, RWTH Aachen University, Sommerfeldstr. 18, 52074, Aachen, Germany.
Stephan PindlInfineon Technologies AG, Wernerwerkstraße 2, 93049, Regensburg, Germany.
Max C LemmeChair of Electronic Devices, RWTH Aachen University, Otto-Blumenthal-Str. 25, 52074, Aachen, Germany. max.lemme@rwth-aachen.de.ORCID http://orcid.org/0000-0003-4552-2411
Infineon Technologies (Germany) · DERWTH Aachen University · DEAMO (Germany) · DEAixtron (Germany) · DEHelmut Schmidt University · DEUniversitat de Barcelona · ES

Funding

Bundesministerium für Bildung und Forschung (Federal Ministry of Education and Research) 03XP0210ABundesministerium für Bildung und Forschung (Federal Ministry of Education and Research) 03XP0210FBundesministerium für Bildung und Forschung (Federal Ministry of Education and Research) 03ZU1106AABundesministerium für Bildung und Forschung (Federal Ministry of Education and Research) 16ME0399Bundesministerium für Bildung und Forschung (Federal Ministry of Education and Research) 16ME0403EC | Horizon 2020 Framework Programme (EU Framework Programme for Research and Innovation H2020) 881603
6 · The paper itself

Abstract

Two-dimensional (2D) materials are considered for numerous applications in microelectronics, although several challenges remain when integrating them into functional devices. Weak adhesion is one of them, caused by their chemical inertness. Quantifying the adhesion of 2D materials on three-dimensional surfaces is, therefore, an essential step toward reliable 2D device integration. To this end, button shear testing is proposed and demonstrated as a method for evaluating the adhesion of 2D materials with the examples of graphene, hexagonal boron nitride (hBN), molybdenum disulfide, and tungsten diselenide on silicon dioxide and silicon nitride substrates. We propose a fabrication process flow for polymer buttons on the 2D materials and establish suitable button dimensions and testing shear speeds. We show with our quantitative data that low substrate roughness and oxygen plasma treatments on the substrates before 2D material transfer result in higher shear strengths. Thermal annealing increases the adhesion of hBN on silicon dioxide and correlates with the thermal interface resistance between these materials. This establishes button shear testing as a reliable and repeatable method for quantifying the adhesion of 2D materials.

Identifiers

PMID38499534
PMCPMC10948857
OpenAlexW4392906546

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.