ArticleNature nanotechnology2024
Local-orbital ptychography for ultrahigh-resolution imaging.
Article in Nature nanotechnology, 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 12 papers.
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Who cites it
12 citing papers in PubMed.
- Polar nano-regions enable large spin Hall conductivity in metallic PtCoONature materials · 2026Article
- Imaging thick objects with deep-subangstrom resolution and deep-subpicometer precision.Science advances · 2026Article
- Precise structure and polarization determination of HfNature communications · 2026Article
- Material-Sensitive and Thickness-Resolved Transmission Imaging Using Coherent Extreme Ultraviolet Radiation.ACS photonics · 2025Article
- Fourier ptychographic enhancement of iterative pathways: autonomous 3D momentum coordination in hybrid ML-PIE architectures.Biomedical optics express · 2025Article
- Unveiling ferroelectric 3D microstructures.Nature materials · 2025Article
- Deep learning for sub-ångström-resolution imaging in uncorrected scanning transmission electron microscopy.National science review · 2025Article
- Revealing disorder parameter and deformation electron density using electron diffraction.Nature communications · 2025Article
- Advancing atomic electron tomography with neural networks.Applied microscopy · 2025Review
- Atomically resolved imaging of radiation-sensitive metal-organic frameworks via electron ptychography.Nature communications · 2025Article
- Review
- Ptychography at all wavelengths.Nature reviews. Methods primers · 2025Article
Corrections and comments
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Authors and funding
5 authors.
Funding
Abstract
Technical advances paired with developments in methodology have enabled electron microscopy to reach atomic resolution. Further improving the information limit in microscopic imaging requires further improvements in methodology. Here we report a ptychographic method that describes the object as the sum of discrete atomic-orbital-like functions (for example, Gaussian functions) and the probe in terms of aberration functions. Using this method, we realize an improved information limit of microscopic imaging, reaching down to 14 pm. High-quality probes and objects contribute to superior signal-to-noise ratios at low electron doses, allowing for relaxation of the sample thickness restriction to 50 nm for dense materials. Additionally, our method has the capability to decompose the total phase into element components, revealing that the information limit is element dependent. With enhanced spatial resolution, signal-to-noise ratio and thickness threshold compared with conventional ptychography methods, our local-orbital ptychography may find applications in atomic-resolution imaging of metals, ceramics, electronic devices or beam-sensitive material.
Identifiers
38286877What OpenQuestion holds
Registered trials
Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.