Evidence map›Paper›PMID 38267459›Full record

ArticleNature communications2024

EUV-induced hydrogen desorption as a step towards large-scale silicon quantum device patterning.

Procopios Constantinou, Taylor J Z Stock, Li-Ting Tseng, Dimitrios Kazazis, Matthias Muntwiler, Carlos A F Vaz, Yasin Ekinci, Gabriel Aeppli, Neil J Curson, Steven R Schofield

Abstract read
In one paragraph

Article in Nature communications, 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 2 papers.

0numbers the graph read from it
0cells of the map it votes in
2citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

2 citing papers in PubMed.

  1. Article
  2. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

10 authors.

Procopios ConstantinouLondon Centre for Nanotechnology, University College London, WC1H 0AH, London, UK. procopios.constantinou@psi.ch.ORCID http://orcid.org/0000-0001-9769-9345
Taylor J Z StockLondon Centre for Nanotechnology, University College London, WC1H 0AH, London, UK.ORCID http://orcid.org/0000-0003-4164-362X
Li-Ting TsengPaul Scherrer Institute, 5232, Villigen PSI, Switzerland.
Dimitrios KazazisPaul Scherrer Institute, 5232, Villigen PSI, Switzerland.ORCID http://orcid.org/0000-0002-2124-2813
Matthias MuntwilerPaul Scherrer Institute, 5232, Villigen PSI, Switzerland.ORCID http://orcid.org/0000-0002-6628-3977
Carlos A F VazPaul Scherrer Institute, 5232, Villigen PSI, Switzerland.ORCID http://orcid.org/0000-0002-6209-8918
Yasin EkinciPaul Scherrer Institute, 5232, Villigen PSI, Switzerland.
Gabriel AeppliPaul Scherrer Institute, 5232, Villigen PSI, Switzerland.ORCID http://orcid.org/0009-0008-1249-9028
Neil J CursonLondon Centre for Nanotechnology, University College London, WC1H 0AH, London, UK.ORCID http://orcid.org/0000-0002-5661-0559
Steven R SchofieldLondon Centre for Nanotechnology, University College London, WC1H 0AH, London, UK. s.schofield@ucl.ac.uk.ORCID http://orcid.org/0000-0002-0727-3015

Funding

EC | Horizon 2020 Framework Programme (EU Framework Programme for Research and Innovation H2020) 810451RCUK | Engineering and Physical Sciences Research Council (EPSRC) EP/L015277/1RCUK | Engineering and Physical Sciences Research Council (EPSRC) EP/M009564/1
6 · The paper itself

Abstract

Atomically precise hydrogen desorption lithography using scanning tunnelling microscopy (STM) has enabled the development of single-atom, quantum-electronic devices on a laboratory scale. Scaling up this technology to mass-produce these devices requires bridging the gap between the precision of STM and the processes used in next-generation semiconductor manufacturing. Here, we demonstrate the ability to remove hydrogen from a monohydride Si(001):H surface using extreme ultraviolet (EUV) light. We quantify the desorption characteristics using various techniques, including STM, X-ray photoelectron spectroscopy (XPS), and photoemission electron microscopy (XPEEM). Our results show that desorption is induced by secondary electrons from valence band excitations, consistent with an exactly solvable non-linear differential equation and compatible with the current 13.5 nm (~92 eV) EUV standard for photolithography; the data imply useful exposure times of order minutes for the 300 W sources characteristic of EUV infrastructure. This is an important step towards the EUV patterning of silicon surfaces without traditional resists, by offering the possibility for parallel processing in the fabrication of classical and quantum devices through deterministic doping.

Identifiers

PMID38267459
PMCPMC10808421

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.