Evidence map›Paper›PMID 38258240›Full record

ArticleMicromachines2024

Electromagnetic Susceptibility Analysis of the Operational Amplifier to Conducted EMI Injected through the Power Supply Port.

Peng Huang, Bing Li, Mengyuan Wei, Xuchun Hao, Xi Chen, Xiaozong Huang, Wei Huang, Shuling Zhou, Xiaokang Wen, Shuguo Xie and 1 more

Abstract read
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In one paragraph

Article in Micromachines, 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

11 authors.

Peng HuangSchool of Electronic and Information Engineering, Beihang University, Beijing 100191, China.ORCID 0009-0009-3317-9776
Bing LiSchool of Electronic and Information Engineering, Beihang University, Beijing 100191, China.
Mengyuan WeiSchool of Electronic and Information Engineering, Beihang University, Beijing 100191, China.
Xuchun HaoSchool of Electronic and Information Engineering, Beihang University, Beijing 100191, China.ORCID 0000-0001-9218-481X
Xi ChenSchool of Electronic and Information Engineering, Beihang University, Beijing 100191, China.
Xiaozong HuangNo. 24 Research Institute, China Electronics Technology Group Corporation, Chongqing 404100, China.
Wei HuangNo. 24 Research Institute, China Electronics Technology Group Corporation, Chongqing 404100, China.
Shuling ZhouNo. 24 Research Institute, China Electronics Technology Group Corporation, Chongqing 404100, China.
Xiaokang WenNo. 24 Research Institute, China Electronics Technology Group Corporation, Chongqing 404100, China.
Shuguo XieSchool of Electronic and Information Engineering, Beihang University, Beijing 100191, China.ORCID 0000-0001-9387-9074
Donglin SuSchool of Electronic and Information Engineering, Beihang University, Beijing 100191, China.

Funding

Civil Aircraft Projects of China Grant No. MJZ5-2N22National Natural Science Foundation of China Grant 62293492, Grant 62293495
6 · The paper itself

Abstract

Operational amplifiers (op-amps) are widely used in circuit systems. The increasing complexity of the power supply network has led to the susceptibility of the power supply port to electromagnetic interference (EMI) in circuit systems. Therefore, it is necessary to investigate the electromagnetic susceptibility (EMS) of op-amps at the power supply port. In this paper, we assessed the effect of EMI on the operational performance of op-amps through the power supply port by a bulk current injection (BCI) method. Firstly, we conducted the continuous sine wave into the power supply port by a current injection probe and measured the change in the offset voltage under EMI. Secondly, we proposed a new method of conducted susceptibility and obtained the susceptibility threshold regularities of the op-amps at the power supply port under the interference of different waveform signals. Our study provided conclusive evidence that EMI reduced the reliability of the op-amp by affecting the offset voltage of op-amps and demonstrated that the sensitivity type of op-amps was peak-sensitive at the power supply port. This study contributed to a deep understanding of the EMS mechanism and guided the design of electromagnetic compatibility (EMC) of op-amps.

Indexed as

electromagnetic environmental effectelectromagnetic interference (EMI)electromagnetic susceptibility (EMS)operational amplifier (op-amp)susceptibility thresholdvoltage follower

Identifiers

PMID38258240
PMCPMC10818561

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.