ArticleIUCrJ2024
Orientational analysis of atomic pair correlations in nanocrystalline indium oxide thin films.
Article in IUCrJ, 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 4 papers.
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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.
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Who cites it
4 citing papers in PubMed.
- Probing local atomic structure in thin films by grazing-incidence total X-ray scattering with a convergent X-ray beam.Journal of applied crystallography · 2026Article
- Identifying Structure and Texture of Metal-Organic Framework CuCrystal growth & design · 2025Article
- Distinguishing isotropic and anisotropic signals for X-ray total scattering using machine learning.Acta crystallographica. Section A, Foundations and advances · 2025Article
- Article
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Authors and funding
12 authors.
Funding
Abstract
The application of grazing-incidence total X-ray scattering (GITXS) for pair distribution function (PDF) analysis using >50 keV X-rays from synchrotron light sources has created new opportunities for structural characterization of supported thin films with high resolution. Compared with grazing-incidence wide-angle X-ray scattering, which is only useful for highly ordered materials, GITXS/PDFs expand such analysis to largely disordered or nanostructured materials by examining the atomic pair correlations dependent on the direction relative to the surface of the supporting substrate. A characterization of nanocrystalline In
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