ArticleJournal of synchrotron radiation2024
In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy.
Article in Journal of synchrotron radiation, 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. An erratum has been issued. Cited by 6 papers.
What it found
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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.
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Who cites it
6 citing papers in PubMed.
- Spatially Resolved Strain Mapping In Flexible Oxide Membranes.Small (Weinheim an der Bergstrasse, Germany) · 2026Article
- Integrated control of a nanoindenter and X-ray nanodiffraction for automated in situ nanomechanical studies.Journal of synchrotron radiation · 2026Article
- How interfaces limit nanoscale stress concentrations and prevent catastrophic failure in single-asperity contacts.Communications materials · 2026Article
- Current View of Nanoindentation: Recent Developments and Application in Material Characterization.ACS applied materials & interfaces · 2025Review
- Resolving the fundamentals of theCommunications materials · 2025Article
- In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy. Corrigendum.Journal of synchrotron radiation · 2024Article
Corrections and comments
- Erratum issued
Authors and funding
5 authors.
Funding
No grant is acknowledged in the PubMed record.
Abstract
The use of hard X-ray transmission nano- and microdiffraction to perform in situ stress and strain measurements during deformation has recently been demonstrated and used to investigate many thin film systems. Here a newly commissioned sample environment based on a commercially available nanoindenter is presented, which is available at the NanoMAX beamline at the MAX IV synchrotron. Using X-ray nanoprobes of around 60-70 nm at 14-16 keV and a scanning step size of 100 nm, we map the strains, stresses, plastic deformation and fracture during nanoindentation of industrial coatings with thicknesses in the range of several micrometres, relatively strong texture and large grains. The successful measurements of such challenging samples illustrate broad applicability. The sample environment is openly accessible for NanoMAX beamline users through the MAX IV sample environment pool, and its capability can be further extended for specific purposes through additional available modules.
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Registered trials
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