Evidence map›Paper›PMID 38005149›Full record

ArticleMaterials (Basel, Switzerland)2023

Local Structural Modifications in Metallic Micropillars Induced by Plasma Focused Ion Beam Processing.

Kritika Singh, Surya Snata Rout, Christina Krywka, Anton Davydok

Abstract read
In one paragraph

Article in Materials (Basel, Switzerland), 2023. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 2 papers.

0numbers the graph read from it
0cells of the map it votes in
2citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

2 citing papers in PubMed.

  1. Article
  2. Review
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

4 authors.

Kritika SinghInstitute of Material Physics, Hemholtz-Zentrum Hereon, Outstation at DESY Notkestr 85, 22607 Hamburg, Germany.
Surya Snata RoutSchool of Earth and Planetary Sciences, National Institute of Science Education and Research, HBNI, Jatani 752050, India.
Christina KrywkaInstitute of Material Physics, Hemholtz-Zentrum Hereon, Outstation at DESY Notkestr 85, 22607 Hamburg, Germany.
Anton DavydokInstitute of Material Physics, Hemholtz-Zentrum Hereon, Outstation at DESY Notkestr 85, 22607 Hamburg, Germany.

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

A focused ion beam scanning electron microscope (FIB-SEM) is a powerful tool that is routinely used for scale imaging from the micro- to nanometer scales, micromachining, prototyping, and metrology. In spite of the significant capabilities of a FIB-SEM, there are inherent artefacts (e.g., structural defects, chemical interactions and phase changes, ion implantation, and material redeposition) that are produced due to the interaction of Ga

Indexed as

focused ion beam millingmagnesiumnanodiffractionsynchrotronTiAlX-ray fluorescence

Identifiers

PMID38005149
PMCPMC10673216

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.