Evidence map›Paper›PMID 37845245›Full record

ArticleScientific reports2023

Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers.

Leora E Dresselhaus-Marais, Bernard Kozioziemski, Theodor S Holstad, Trygve Magnus Ræder, Matthew Seaberg, Daewoong Nam, Sangsoo Kim, Sean Breckling, Sungwook Choi, Matthieu Chollet and 33 more

Abstract read
In one paragraph

Article in Scientific reports, 2023. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 4 papers.

0numbers the graph read from it
0cells of the map it votes in
4citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

4 citing papers in PubMed.

  1. Review
  2. Review
  3. Article
  4. Real-time imaging of acoustic waves in bulk materials with X-ray microscopy.Proceedings of the National Academy of Sciences of the United States of America · 2023
    Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

43 authors.

Leora E Dresselhaus-MaraisDepartment of Materials Science & Engineering, Stanford University, Stanford, CA, USA. leoradm@stanford.edu.
Bernard KozioziemskiPhysics Division, Lawrence Livermore National Laboratory, Livermore, CA, USA.
Theodor S HolstadDepartment of Physics, Technical University of Denmark, Lyngby, Denmark.
Trygve Magnus RæderDepartment of Physics, Technical University of Denmark, Lyngby, Denmark.
Matthew SeabergSLAC National Accelerator Laboratory, Menlo Park, CA, USA.
Daewoong NamPhoton Science Center, Pohang University and Science and Technology, Pohang, Korea.
Sangsoo KimXFEL Beamline Department, Pohang Accelerator Laboratory, Pohang University and Science and Technology, Pohang, Korea.
Sean BrecklingNevada National Security Sites, Las Vegas, NV, USA.
Sungwook ChoiDepartment of Physics, Sogang University, Seoul, Korea.
Matthieu CholletSLAC National Accelerator Laboratory, Menlo Park, CA, USA.
Philip K CookUniversity of Natural Resources and Life Sciences, BOKU, Vienna, Austria.
Eric FolsomPhysics Division, Lawrence Livermore National Laboratory, Livermore, CA, USA.
Eric GaltierSLAC National Accelerator Laboratory, Menlo Park, CA, USA.
Arnulfo GonzalezNevada National Security Sites, Las Vegas, NV, USA.
Tais GorkhoverSLAC National Accelerator Laboratory, Menlo Park, CA, USA.
Serge GuilletSLAC National Accelerator Laboratory, Menlo Park, CA, USA.
Kristoffer HaldrupDepartment of Physics, Technical University of Denmark, Lyngby, Denmark.
Marylesa HowardNevada National Security Sites, Las Vegas, NV, USA.
Kento KatagiriDepartment of Materials Science & Engineering, Stanford University, Stanford, CA, USA.
Seonghan KimXFEL Beamline Department, Pohang Accelerator Laboratory, Pohang University and Science and Technology, Pohang, Korea.
Sunam KimXFEL Beamline Department, Pohang Accelerator Laboratory, Pohang University and Science and Technology, Pohang, Korea.
Sungwon KimDepartment of Physics, Sogang University, Seoul, Korea.
Hyunjung KimDepartment of Physics, Sogang University, Seoul, Korea.
Erik Bergbäck KnudsenDepartment of Physics, Technical University of Denmark, Lyngby, Denmark.
Stephan KuschelSLAC National Accelerator Laboratory, Menlo Park, CA, USA.
Hae Ja LeeSLAC National Accelerator Laboratory, Menlo Park, CA, USA.
Chuanlong LinCenter for High Pressure Science & Technology Advanced Research, Shanghai, China.
R Stewart McWilliamsSchool of Physics and Astronomy, University of Edinburgh, Edinburgh, UK.
Bob NaglerSLAC National Accelerator Laboratory, Menlo Park, CA, USA.
Martin Meedom NielsenDepartment of Physics, Technical University of Denmark, Lyngby, Denmark.
Norimasa OzakiGraduate School of Engineering, Osaka University, Osaka, Japan.
Dayeeta PalDepartment of Materials Science & Engineering, Stanford University, Stanford, CA, USA.
Ricardo Pablo PedroDepartment of Nuclear Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA.
Alison M SaundersPhysics Division, Lawrence Livermore National Laboratory, Livermore, CA, USA.
Frank SchoofsUK Atomic Energy Authority, Culham Science Centre, Abingdon, UK.
Toshimori SekineCenter for High Pressure Science & Technology Advanced Research, Shanghai, China.
Hugh SimonsDepartment of Physics, Technical University of Denmark, Lyngby, Denmark.
Tim van DrielSLAC National Accelerator Laboratory, Menlo Park, CA, USA.
Bihan WangCenter for High Pressure Science & Technology Advanced Research, Shanghai, China.
Wenge YangCenter for High Pressure Science & Technology Advanced Research, Shanghai, China.
Can YildirimEuropean Synchrotron Radiation Facility, Grenoble, France.
Henning Friis PoulsenDepartment of Physics, Technical University of Denmark, Lyngby, Denmark.
Jon H EggertPhysics Division, Lawrence Livermore National Laboratory, Livermore, CA, USA.

Funding

European Research Council Advanced Grant # 885022European Research Council Starting Grant # 804665
6 · The paper itself

Abstract

The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, dark field X-ray microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the [Formula: see text] photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.

Identifiers

PMID37845245
PMCPMC10579415

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.