Evidence map›Paper›PMID 37836990›Full record

ReviewSensors (Basel, Switzerland)2023

An Overview of Image Generation of Industrial Surface Defects.

Xiaopin Zhong, Junwei Zhu, Weixiang Liu, Chongxin Hu, Yuanlong Deng, Zongze Wu

Abstract readReview
In one paragraph

Review in Sensors (Basel, Switzerland), 2023. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 6 papers.

0numbers the graph read from it
0cells of the map it votes in
6citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

6 citing papers in PubMed.

  1. Article
  2. Article
  3. Review
  4. Article
  5. Article
  6. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

6 authors.

Xiaopin ZhongCollege of Mechatronics and Control Engineering, Shenzhen University, Nanhai Ave., Shenzhen 518060, China.ORCID 0000-0002-8761-9396
Junwei ZhuCollege of Mechatronics and Control Engineering, Shenzhen University, Nanhai Ave., Shenzhen 518060, China.
Weixiang LiuCollege of Mechatronics and Control Engineering, Shenzhen University, Nanhai Ave., Shenzhen 518060, China.ORCID 0000-0001-7198-6311
Chongxin HuCollege of Mechatronics and Control Engineering, Shenzhen University, Nanhai Ave., Shenzhen 518060, China.
Yuanlong DengShenzhen Institute of Technology, Jiangjunmao Road, Shenzhen 518116, China.ORCID 0000-0001-6162-2127
Zongze WuCollege of Mechatronics and Control Engineering, Shenzhen University, Nanhai Ave., Shenzhen 518060, China.

Funding

National Key R&D Program of China 2020AAA0108304National Natural Science Foundation of China 62171288
6 · The paper itself

Abstract

Intelligent defect detection technology combined with deep learning has gained widespread attention in recent years. However, the small number, and diverse and random nature, of defects on industrial surfaces pose a significant challenge to deep learning-based methods. Generating defect images can effectively solve this problem. This paper investigates and summarises traditional defect generation and deep learning-based methods. It analyses the various advantages and disadvantages of these methods and establishes a benchmark through classical adversarial networks and diffusion models. The performance of these methods in generating defect images is analysed through various indices. This paper discusses the existing methods, highlights the shortcomings and challenges in the field of defect image generation, and proposes future research directions. Finally, the paper concludes with a summary.

Indexed as

diffusion modelgenerating adversarial networkimage generation

Identifiers

PMID37836990
PMCPMC10575288

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.