Evidence map›Paper›PMID 37630142›Full record

ArticleMicromachines2023

Metal-Induced Trap States: The Roles of Interface and Border Traps in HfO

Huy-Binh Do, Quang-Ho Luc, Phuong V Pham, Anh-Vu Phan-Gia, Thanh-Son Nguyen, Hoang-Minh Le, Maria Merlyne De Souza

Abstract read
In one paragraph

Article in Micromachines, 2023. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

7 authors.

Huy-Binh DoFaculty of Applied Science, Ho Chi Minh City University of Technology and Education, 01 Vo Van Ngan Street, Ho Chi Minh City 700000, Vietnam.ORCID 0000-0003-3274-5050
Quang-Ho LucDepartment of Materials Science and Engineering, National Yang Ming Chiao Tung University, 1001, Daxue Road, East District, Hsinchu 300093, Taiwan.
Phuong V PhamDepartment of Physics, National Sun Yat-sen University, Kaohsiung 80424, Taiwan.
Anh-Vu Phan-GiaFaculty of Applied Science, Ho Chi Minh City University of Technology and Education, 01 Vo Van Ngan Street, Ho Chi Minh City 700000, Vietnam.
Thanh-Son NguyenFaculty of Fundamental Sciences, University of Architecture Ho Chi Minh City, 196 Pasteur St., Dist. 3, Ho Chi Minh City 700000, Vietnam.ORCID 0009-0006-4240-9287
Hoang-Minh LeFaculty of electrical and electronics engineering, Ho Chi Minh City University of Technology and Education, 01 Vo Van Ngan Street, Ho Chi Minh City 700000, Vietnam.
Maria Merlyne De SouzaEEE Department, University of Sheffield, Sheffield S10 2TN, UK.ORCID 0000-0002-7804-7154

Funding

Ho Chi Minh City University of Technology and Education T2022-29
6 · The paper itself

Abstract

By combining capacitance-voltage measurements, TCAD simulations, and X-ray photoelectron spectroscopy, the impact of the work function of the gate metals Ti, Mo, Pd, and Ni on the defects in bulk HfO

Indexed as

acceptor-like and donor-like trapsborder trapsdefects in HfO2electronic band structureHf 4f peaksinterface trapsvalence band maximum

Identifiers

PMID37630142
PMCPMC10456933

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.