Evidence map›Paper›PMID 37629919›Full record

ArticleMaterials (Basel, Switzerland)2023

Quality Assessment of Processed Graphene Chips for Biosensor Application.

Natalia M Shmidt, Evgeniya I Shabunina, Ekaterina V Gushchina, Vasiliy N Petrov, Ilya A Eliseyev, Sergey P Lebedev, Sergei Iu Priobrazhenskii, Elena M Tanklevskaya, Mikhail V Puzyk, Alexander D Roenkov and 2 more

Abstract read
In one paragraph

Article in Materials (Basel, Switzerland), 2023. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

12 authors.

Natalia M ShmidtIoffe Institute, 26 Politekhnicheskaya, 194021 St. Petersburg, Russia.
Evgeniya I ShabuninaIoffe Institute, 26 Politekhnicheskaya, 194021 St. Petersburg, Russia.ORCID 0000-0003-4457-8149
Ekaterina V GushchinaIoffe Institute, 26 Politekhnicheskaya, 194021 St. Petersburg, Russia.
Vasiliy N PetrovIoffe Institute, 26 Politekhnicheskaya, 194021 St. Petersburg, Russia.
Ilya A EliseyevIoffe Institute, 26 Politekhnicheskaya, 194021 St. Petersburg, Russia.
Sergey P LebedevIoffe Institute, 26 Politekhnicheskaya, 194021 St. Petersburg, Russia.ORCID 0000-0002-5078-1322
Sergei Iu PriobrazhenskiiIoffe Institute, 26 Politekhnicheskaya, 194021 St. Petersburg, Russia.
Elena M TanklevskayaIoffe Institute, 26 Politekhnicheskaya, 194021 St. Petersburg, Russia.
Mikhail V PuzykFaculty of Chemistry, Herzen State Pedagogical University of Russia, 191186 St. Petersburg, Russia.
Alexander D RoenkovNitride Crystals Group, 194156 St. Petersburg, Russia.
Alexander S UsikovNitride Crystals Group, 194156 St. Petersburg, Russia.
Alexander A LebedevIoffe Institute, 26 Politekhnicheskaya, 194021 St. Petersburg, Russia.ORCID 0000-0003-0829-5053

Funding

Ministry of Science and Higher Education of the Russian Federation 075-15-2021-1349
6 · The paper itself

Abstract

The quality of graphene intended for use in biosensors was assessed on manufactured chips using a set of methods including atomic force microscopy (AFM), Raman spectroscopy, and low-frequency noise investigation. It is shown that local areas of residues on the graphene surface, formed as a result of the interaction of graphene with a photoresist at the initial stage of chip development, led to a spread of chip resistance (R) in the range of 1-10 kOhm and to an increase in the root mean square (RMS) roughness up to 10 times, which can significantly worsen the reproducibility of the parameters of graphene chips for biosensor applications. It was observed that the control of the photoresist residues after photolithography (PLG) using AFM and subsequent additional cleaning reduced the spread of R values in chips to 1-1.6 kOhm and obtained an RMS roughness similar to the roughness in the graphene film before PLG. Monitoring of the spectral density of low-frequency voltage fluctuation (S

Indexed as

graphene chiplow-frequency noisephotoresist residuessurface topography

Identifiers

PMID37629919
PMCPMC10456491

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.