Evidence map›Paper›PMID 37570484›Full record

ArticleNanomaterials (Basel, Switzerland)2023

Analyzing Acceptor-like State Distribution of Solution-Processed Indium-Zinc-Oxide Semiconductor Depending on the In Concentration.

Dongwook Kim, Hyeonju Lee, Youngjun Yun, Jaehoon Park, Xue Zhang, Jin-Hyuk Bae, Sungkeun Baang

Open access · goldAbstract read
In one paragraph

Article in Nanomaterials (Basel, Switzerland), 2023. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
0.5field-weighted citation impact, top 36% of its field
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed, 4 citations in OpenAlex.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

7 authors at 2 institutions in 1 country.

Dongwook KimSchool of Information Science, Hallym University, Chuncheon 24252, Republic of Korea.
Hyeonju LeeSchool of Information Science, Hallym University, Chuncheon 24252, Republic of Korea.
Youngjun YunSchool of Nano Convergence Technology, Hallym University, Chuncheon 24252, Republic of Korea.
Jaehoon ParkSchool of Information Science, Hallym University, Chuncheon 24252, Republic of Korea.
Xue ZhangCollege of Ocean Science and Engineering, Shangdong University of Science and Technology, Qingdao 266590, China.
Jin-Hyuk BaeSchool of Electronics Engineering, Kyungpook National University, Daegu 41566, Republic of Korea.ORCID 0000-0003-3217-1309
Sungkeun BaangSchool of Information Science, Hallym University, Chuncheon 24252, Republic of Korea.
Hallym University · KRKyungpook National University · KR

Funding

Hallym University HRF-202207-006
6 · The paper itself

Abstract

Understanding the density of state (DOS) distribution in solution-processed indium-zinc-oxide (IZO) thin-film transistors (TFTs) is crucial for addressing electrical instability. This paper presents quantitative calculations of the acceptor-like state distribution of solution-processed IZO TFTs using thermal energy analysis. To extract the acceptor-like state distribution, the electrical characteristics of IZO TFTs with various In molarity ratios were analyzed with respect to temperature. An Arrhenius plot was used to determine electrical parameters such as the activation energy, flat band energy, and flat band voltage. Two calculation methods, the simplified charge approximation and the Meyer-Neldel (MN) rule-based carrier-surface potential field-effect analysis, were proposed to estimate the acceptor-like state distribution. The simplified charge approximation established the modeling of acceptor-like states using the charge-voltage relationship. The MN rule-based field-effect analysis validated the DOS distribution through the carrier-surface potential relationship. In addition, this study introduces practical and effective approaches for determining the DOS distribution of solution-processed IZO semiconductors based on the In molarity ratio. The profiles of the acceptor-like state distribution provide insights into the electrical behavior depending on the doping concentration of the solution-processed IZO semiconductors.

Indexed as

density of statesolution-processed IZO semiconductorthermal analysisthin-film transistor

Identifiers

PMID37570484
PMCPMC10421299
OpenAlexW4385318260

What OpenQuestion holds

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LicenceCC BY
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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.